{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,13]],"date-time":"2024-08-13T13:16:00Z","timestamp":1723554960772},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/vts.2019.8758642","type":"proceedings-article","created":{"date-parts":[[2019,7,11]],"date-time":"2019-07-11T23:56:14Z","timestamp":1562889374000},"source":"Crossref","is-referenced-by-count":6,"title":["Diagnosis Outcome Preview through Learning"],"prefix":"10.1109","author":[{"given":"Chenlei","family":"Fang","sequence":"first","affiliation":[]},{"given":"Qicheng","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Soumya","family":"Mittal","sequence":"additional","affiliation":[]},{"given":"R. D. Shawn","family":"Blanton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228462"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref12","author":"geron","year":"2017","journal-title":"Hands-On Machine Learning with Scikit-Learn and Tensor-Flow Concepts Tools and Techniques to Build Intelligent Systems"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387327"},{"key":"ref14","author":"witten","year":"2016","journal-title":"Data Mining Practical Machine Learning Tools and Techniques"},{"key":"ref4","article-title":"Determining a Failure Root Cause Distribution from a Population of Layout-aware Scan Diagnosis Results","author":"benware","year":"2012","journal-title":"IEEE Design & Test of Computers"},{"key":"ref3","article-title":"Diagnostic Resolution Improvement through Learning-Guided Physical Failure Analvsis","author":"lim","year":"2016","journal-title":"International Test Conference"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.117"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2113670"},{"key":"ref8","article-title":"Improving Diagnostic Efficiency via Machine Learning","author":"huang","year":"2018","journal-title":"International Test Conference"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178587"},{"key":"ref2","article-title":"Improving Diagnostic Resolution of Failing ICs through Learning","author":"xue","year":"2016","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651899"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699231"}],"event":{"name":"2019 IEEE 37th VLSI Test Symposium (VTS)","location":"Monterey, CA, USA","start":{"date-parts":[[2019,4,23]]},"end":{"date-parts":[[2019,4,25]]}},"container-title":["2019 IEEE 37th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8753115\/8758605\/08758642.pdf?arnumber=8758642","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T14:52:56Z","timestamp":1658155976000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8758642\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/vts.2019.8758642","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}