{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T16:11:18Z","timestamp":1725725478499},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/vts.2019.8758660","type":"proceedings-article","created":{"date-parts":[[2019,7,11]],"date-time":"2019-07-11T23:56:14Z","timestamp":1562889374000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Leveraging Memory PUFs and PIM-based encryption to secure edge deep learning systems"],"prefix":"10.1109","author":[{"given":"Wen","family":"Li","sequence":"first","affiliation":[]},{"given":"Ying","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Huawei","family":"Li","sequence":"additional","affiliation":[]},{"given":"Xiaowei","family":"Li","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3134057"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3128572.3140444"},{"key":"ref12","first-page":"201","article-title":"Cryptonets: Applying neural networks to encrypted data with high throughput and accuracy","author":"dowlin","year":"0","journal-title":"ICML 2016"},{"key":"ref13","article-title":"Deepsecure: Scalable provably-secure deep learning","author":"rouhani","year":"2017","journal-title":"CoRR vol abs\/1705 08963"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287695"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2897995"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176696"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855578"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2015.7440331"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3134077"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3052973.3053009"},{"key":"ref6","article-title":"Adversarial attacks against medical deep learning systems","author":"finlayson","year":"2018","journal-title":"CoRR vol abs\/1804 05296"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3132747.3132785"},{"key":"ref8","article-title":"Badnets: Identifying vulnerabilities in the machine learning model supply chain","author":"gu","year":"2017","journal-title":"CoRR vol abs\/1708 06733"},{"key":"ref7","article-title":"Explaining and harnessing adversarial examples","author":"goodfellow","year":"2014","journal-title":"Computer Science"},{"key":"ref2","article-title":"Intriguing properties of neural networks","author":"szegedy","year":"2013","journal-title":"Computer Science"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2016.41"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2541940.2541967"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2018.00026"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3123939.3124544"},{"key":"ref21","article-title":"LDPUF: exploiting DRAM latency variations to generate robust device signatures","author":"talukder","year":"2018","journal-title":"CoRR vol abs\/1808 02584"}],"event":{"name":"2019 IEEE 37th VLSI Test Symposium (VTS)","start":{"date-parts":[[2019,4,23]]},"location":"Monterey, CA, USA","end":{"date-parts":[[2019,4,25]]}},"container-title":["2019 IEEE 37th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8753115\/8758605\/08758660.pdf?arnumber=8758660","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T14:52:56Z","timestamp":1658155976000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8758660\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/vts.2019.8758660","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}