{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T17:53:59Z","timestamp":1764784439618,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/vts48691.2020.9107566","type":"proceedings-article","created":{"date-parts":[[2020,6,4]],"date-time":"2020-06-04T16:30:31Z","timestamp":1591288231000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["A New Secure Scan Design with PUF-based Key for Authentication"],"prefix":"10.1109","author":[{"given":"Qidong","family":"Wang","sequence":"first","affiliation":[]},{"given":"Aijiao","family":"Cui","sequence":"additional","affiliation":[]},{"given":"Gang","family":"Qu","sequence":"additional","affiliation":[]},{"given":"Huawei","family":"Li","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-010-9088-4"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1200","DOI":"10.1109\/TVLSI.2005.859470","article-title":"Extracting secret keys from integrated circuits","volume":"13","author":"lim","year":"2005","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2013.6509668"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/WAC.2006.375932"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1587\/elex.9.1051"},{"key":"ref4","first-page":"407","article-title":"Scan-based attack against elliptic curve cryptosystems","author":"nara","year":"2010","journal-title":"Proc Asia South Pacific Des Autom Conf (ASP-DAC)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862745"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2089071"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-7720-x"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7538900"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70215"},{"key":"ref2","first-page":"339","article-title":"Scan-based side-channel attack on dedicated hardware implementations of data encryption standard","author":"yang","year":"2004","journal-title":"Proc of the Int Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2401019"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2613847"}],"event":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","start":{"date-parts":[[2020,4,5]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2020,4,8]]}},"container-title":["2020 IEEE 38th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9106465\/9107548\/09107566.pdf?arnumber=9107566","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T11:16:32Z","timestamp":1656587792000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9107566\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/vts48691.2020.9107566","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}