{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T09:35:10Z","timestamp":1762508110645,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/vts48691.2020.9107591","type":"proceedings-article","created":{"date-parts":[[2020,6,4]],"date-time":"2020-06-04T20:30:31Z","timestamp":1591302631000},"page":"1-6","source":"Crossref","is-referenced-by-count":10,"title":["Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects"],"prefix":"10.1109","author":[{"given":"Somayeh","family":"Sadeghi-Kohan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sybille","family":"Hellebrand","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2032288"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/16.278507"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.805728"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397354"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2012.2184288"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3299902.3313156"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.5111159"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1667062.1667066"},{"key":"ref18","first-page":"503","article-title":"Wire sizing with scattering effect for nanoscale interconnection","author":"shian","year":"2006","journal-title":"Proc Asia and South Pacific Design Automation Conference"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2016.7479234"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112713"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771785"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401583"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2010.04.014"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/96.704931"},{"key":"ref7","article-title":"Extensive analysis of resistance evolution due to electromigration induced degradation","volume":"123521","author":"phys","year":"2008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176516"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2864255"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1999.810665"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2645448"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2397934"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744924"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-0630-0"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2771441"}],"event":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","start":{"date-parts":[[2020,4,5]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2020,4,8]]}},"container-title":["2020 IEEE 38th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9106465\/9107548\/09107591.pdf?arnumber=9107591","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T15:16:32Z","timestamp":1656602192000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9107591\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/vts48691.2020.9107591","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}