{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,22]],"date-time":"2025-12-22T10:45:40Z","timestamp":1766400340576,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/vts48691.2020.9107597","type":"proceedings-article","created":{"date-parts":[[2020,6,4]],"date-time":"2020-06-04T20:30:31Z","timestamp":1591302631000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing"],"prefix":"10.1109","author":[{"given":"Dong","family":"Xiang","sequence":"first","affiliation":[]},{"given":"Jiaming","family":"Cai","sequence":"additional","affiliation":[]},{"given":"Bo","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"1050","DOI":"10.1109\/43.238041","article-title":"3-weight pseudo-random test generation based on a deterministic test set for combinational and sequential circuits","volume":"12","author":"pomeranz","year":"1993","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"year":"0","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231071"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2013.14"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.856978"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70767"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923260"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2606248"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2159542.2159550"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2280170"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.67"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837985"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/12.536233"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0280"},{"key":"ref8","first-page":"1","article-title":"Novel approach to reduce power droop during scan-based logic BIST","author":"omana","year":"2013","journal-title":"Proc IEEE Eur Test Symp"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70794"},{"key":"ref2","first-page":"506","article-title":"Timing-driven test point insertion for full-scan and partial-scan BIST","author":"cheng","year":"1995","journal-title":"Proc ITC"},{"article-title":"Built-in Test for VLSI: Pseudo-Random Techniques","year":"1987","author":"bardell","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2572606"}],"event":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","start":{"date-parts":[[2020,4,5]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2020,4,8]]}},"container-title":["2020 IEEE 38th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9106465\/9107548\/09107597.pdf?arnumber=9107597","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T15:04:42Z","timestamp":1656601482000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9107597\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/vts48691.2020.9107597","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}