{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,10]],"date-time":"2025-09-10T22:46:21Z","timestamp":1757544381096,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/vts48691.2020.9107600","type":"proceedings-article","created":{"date-parts":[[2020,6,4]],"date-time":"2020-06-04T20:30:31Z","timestamp":1591302631000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["LSTM-based Analysis of Temporally- and Spatially-Correlated Signatures for Intermittent Fault Detection"],"prefix":"10.1109","author":[{"given":"Xingyi","family":"Wang","sequence":"first","affiliation":[]},{"given":"Li","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2015.7315137"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCID.2011.62"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2013.07.065"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2706558"},{"key":"ref14","first-page":"51","article-title":"Fine-grained aging prediction based on the monitoring of run-time stress using dft infrastructure","author":"koneru","year":"2015","journal-title":"IEEE\/ACM International Conference on Computer-Aided Design"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317918"},{"key":"ref16","first-page":"850","article-title":"Learning to forget: continual prediction with LSTM","author":"gers","year":"1999","journal-title":"International Conference on Artificial Neural Networks"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223701"},{"key":"ref18","first-page":"7","article-title":"The microarchitecture of the intel pentium 4 processor on 90nm technology","volume":"8","author":"boggs","year":"2004","journal-title":"Intel Technology Journal"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2016.7929192"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364449"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"},{"key":"ref6","first-page":"496","article-title":"A unified online fault detection scheme via checking of stability violation","author":"yan","year":"2009","journal-title":"Design Automation and Test in Europe"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342071"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062318"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2484058"},{"key":"ref9","article-title":"Impact of intermittent faults on nan-ocomputing devices","author":"constantinescu","year":"2007","journal-title":"Workshop on Dependable and Secure Nanocomputing"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"},{"article-title":"ITC99 Benchmark","year":"1999","author":"davidson","key":"ref21"}],"event":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","start":{"date-parts":[[2020,4,5]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2020,4,8]]}},"container-title":["2020 IEEE 38th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9106465\/9107548\/09107600.pdf?arnumber=9107600","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T15:04:41Z","timestamp":1656601481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9107600\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/vts48691.2020.9107600","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}