{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T20:14:38Z","timestamp":1772828078763,"version":"3.50.1"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T00:00:00Z","timestamp":1619308800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T00:00:00Z","timestamp":1619308800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T00:00:00Z","timestamp":1619308800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,25]]},"DOI":"10.1109\/vts50974.2021.9441034","type":"proceedings-article","created":{"date-parts":[[2021,5,31]],"date-time":"2021-05-31T21:36:38Z","timestamp":1622496998000},"page":"1-7","source":"Crossref","is-referenced-by-count":7,"title":["Trim Time Reduction in Analog\/RF ICs Based on Inter-Trim Correlation"],"prefix":"10.1109","author":[{"given":"V. A.","family":"Niranjan","sequence":"first","affiliation":[]},{"given":"D.","family":"Neethirajan","sequence":"additional","affiliation":[]},{"given":"C.","family":"Xanthopoulos","sequence":"additional","affiliation":[]},{"given":"E. De La","family":"Rosa","sequence":"additional","affiliation":[]},{"given":"C.","family":"Alleyne","sequence":"additional","affiliation":[]},{"given":"S.","family":"Mier","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Makris","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2243750"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2361716"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2015.09.014"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342415"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2333311"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.05.003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907232"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699225"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035319"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7539168"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2220332"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2010.5477307"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2009.2017249"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.123"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.853893"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477297"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009454"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2598184"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IEMT.2014.7123112"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035329"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050756"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2017196"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477261"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2066630"}],"event":{"name":"2021 IEEE 39th VLSI Test Symposium (VTS)","location":"San Diego, CA, USA","start":{"date-parts":[[2021,4,25]]},"end":{"date-parts":[[2021,4,28]]}},"container-title":["2021 IEEE 39th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9440994\/9440995\/09441034.pdf?arnumber=9441034","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:58Z","timestamp":1652197318000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9441034\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,25]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/vts50974.2021.9441034","relation":{},"subject":[],"published":{"date-parts":[[2021,4,25]]}}}