{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:07:20Z","timestamp":1740100040889,"version":"3.37.3"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T00:00:00Z","timestamp":1619308800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T00:00:00Z","timestamp":1619308800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,25]],"date-time":"2021-04-25T00:00:00Z","timestamp":1619308800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,25]]},"DOI":"10.1109\/vts50974.2021.9441036","type":"proceedings-article","created":{"date-parts":[[2021,5,31]],"date-time":"2021-05-31T21:36:38Z","timestamp":1622496998000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Reliability Evaluation of the Count Min Sketch (CMS) against Single Event Transients (SETs)"],"prefix":"10.1109","author":[{"given":"Jinhua","family":"Zhu","sequence":"first","affiliation":[]},{"given":"Zhen","family":"Gao","sequence":"additional","affiliation":[]},{"given":"Jie","family":"Jin","sequence":"additional","affiliation":[]},{"given":"Pedro","family":"Reviriego","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2254128"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2342872"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2961736"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.2987890"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3182\/20120403-3-DE-3010.00005"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"ref16","first-page":"738","volume":"54","author":"calomarde","year":"2014","journal-title":"SET and noise fault tolerant circuit design techniques Application to 7 nm FinFET Microelectronics Reliability"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/12.59860"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1234528"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2096149.2096152"},{"key":"ref4","volume":"188","author":"singh","year":"2020","journal-title":"Probabilistic data structures for big data analytics A comprehensive review Knowledge-Based Systems"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10723-013-9277-0"},{"journal-title":"New estimation algorithms for streaming data Countmin can do more","year":"2007","author":"deng","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jalgor.2003.12.001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2019.2953907"},{"key":"ref7","article-title":"Count-Min-Log sketch: Approximately counting with approximate counters","author":"pitel","year":"2015","journal-title":"International Symposium on Web AlGorithms"},{"key":"ref2","first-page":"4127","volume":"6","author":"tu","year":"2010","journal-title":"Finding frequent items over data stream Journal of Computational Information Systems"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3975(03)00400-6"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910294"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/859716.859719"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2011.127"}],"event":{"name":"2021 IEEE 39th VLSI Test Symposium (VTS)","start":{"date-parts":[[2021,4,25]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2021,4,28]]}},"container-title":["2021 IEEE 39th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9440994\/9440995\/09441036.pdf?arnumber=9441036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:58Z","timestamp":1652197318000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9441036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,25]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/vts50974.2021.9441036","relation":{},"subject":[],"published":{"date-parts":[[2021,4,25]]}}}