{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:27:53Z","timestamp":1749619673176,"version":"3.37.3"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,4,25]],"date-time":"2022-04-25T00:00:00Z","timestamp":1650844800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,4,25]],"date-time":"2022-04-25T00:00:00Z","timestamp":1650844800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004830","name":"Siemens","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004830","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,4,25]]},"DOI":"10.1109\/vts52500.2021.9794178","type":"proceedings-article","created":{"date-parts":[[2022,6,15]],"date-time":"2022-06-15T20:19:24Z","timestamp":1655324364000},"page":"1-7","source":"Crossref","is-referenced-by-count":8,"title":["MBIST-based Trim-Search Test Time Reduction for STT-MRAM"],"prefix":"10.1109","author":[{"given":"Christopher","family":"Munch","sequence":"first","affiliation":[{"name":"Karlsruhe Institute of Technology (KIT),Department of Computer Science,Karlsruhe,Germany"}]},{"given":"Jongsin","family":"Yun","sequence":"additional","affiliation":[{"name":"Siemens Digital Industries Software,Wilsonville,USA"}]},{"given":"Martin","family":"Keim","sequence":"additional","affiliation":[{"name":"Siemens Digital Industries Software,Wilsonville,USA"}]},{"given":"Mehdi B.","family":"Tahoori","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute of Technology (KIT),Department of Computer Science,Karlsruhe,Germany"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2016.2547779"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2630315"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696079"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2015.7338359"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351201"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662444"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2889106"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/0470035706"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131564"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465383"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1116\/1.3301579"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.29"},{"key":"ref6","article-title":"STT-MRAM: A Robust Embedded Non-Volatile Memory with Superior Reliability and Immunity to External Magnetic Field and RF Sources","author":"naik","year":"2021","journal-title":"Symposium on VLSI Technology"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2961505"},{"key":"ref8","article-title":"Reliability and magnetic immunity of reflow-capable embedded STT-MRAM in 16nm FinFET CMOS process","author":"chen","year":"2021","journal-title":"Symposium on VLSI Technology"},{"key":"ref7","article-title":"12.5 Mb\/mm2 embedded MRAM for high density non-volatile RAM applications","author":"suh","year":"2021","journal-title":"Symposium on VLSI Technology"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2015.24"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2804"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624725"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.2219997"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2872584"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9162803"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993454"}],"event":{"name":"2022 IEEE 40th VLSI Test Symposium (VTS)","start":{"date-parts":[[2022,4,25]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2022,4,27]]}},"container-title":["2022 IEEE 40th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9793839\/9794139\/09794178.pdf?arnumber=9794178","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,11]],"date-time":"2022-07-11T20:04:40Z","timestamp":1657569880000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9794178\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,4,25]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/vts52500.2021.9794178","relation":{},"subject":[],"published":{"date-parts":[[2022,4,25]]}}}