{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:37:50Z","timestamp":1740101870710,"version":"3.37.3"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,24]],"date-time":"2023-04-24T00:00:00Z","timestamp":1682294400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,24]],"date-time":"2023-04-24T00:00:00Z","timestamp":1682294400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4,24]]},"DOI":"10.1109\/vts56346.2023.10140070","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:35:17Z","timestamp":1685734517000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs <sup>*<\/sup>"],"prefix":"10.1109","author":[{"given":"Shao-Chun","family":"Hung","sequence":"first","affiliation":[{"name":"Duke University,Department of Electrical and Computer Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arjun","family":"Chaudhuri","sequence":"additional","affiliation":[{"name":"Duke University,Department of Electrical and Computer Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanmitra","family":"Banerjee","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"Arizona State University,School of Electrical, Computer and Energy Engineering"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.aiopen.2021.01.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/BF01386390"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651899"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3041026"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ULIS.2015.7063799"},{"key":"ref3","article-title":"W and Copper interconnection stability for 3D VLSI CoolCube integration","author":"fenouillet-beranger","year":"2015","journal-title":"International Conference on Solid State Devices and Materials"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1986.1270196"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218582"},{"key":"ref5","first-page":"448","article-title":"Graph neural network-based delay-fault localization for monolithic 3D ICs","author":"hung","year":"2022","journal-title":"Proc IEEE Design Automation and Test Europe Conf and Exhibition"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2387827"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268483"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/S3S.2014.7028195"}],"event":{"name":"2023 IEEE 41st VLSI Test Symposium (VTS)","start":{"date-parts":[[2023,4,24]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2023,4,26]]}},"container-title":["2023 IEEE 41st VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10139918\/10139926\/10140070.pdf?arnumber=10140070","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T17:49:26Z","timestamp":1687196966000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10140070\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4,24]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/vts56346.2023.10140070","relation":{},"subject":[],"published":{"date-parts":[[2023,4,24]]}}}