{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T02:56:48Z","timestamp":1725764208235},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,22]]},"DOI":"10.1109\/vts60656.2024.10538659","type":"proceedings-article","created":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T17:24:14Z","timestamp":1717003454000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Test Compaction Using (k, 1)-Cycle Tests"],"prefix":"10.1109","author":[{"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[{"name":"Purdue University,School of Electrical and Computer Engineering,West Lafayette,IN,U.S.A,47907"}]}],"member":"263","reference":[{"key":"ref1","first-page":"189","article-title":"Test Generation and Dynamic Compaction of Tests","volume-title":"Proc. Test Conf.","author":"Goel"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.476580"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/288548.288615"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.819424"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783735"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2491477.2491488"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805866"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805828"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2608984"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368647"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2018.8373264"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2919233"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2921345"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250810"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50571.2021.00035"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774597"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/43.406714"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1998.741614"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219101"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437648"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469580"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.40"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2587687"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624752"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544389"}],"event":{"name":"2024 IEEE 42nd VLSI Test Symposium (VTS)","start":{"date-parts":[[2024,4,22]]},"location":"Tempe, AZ, USA","end":{"date-parts":[[2024,4,24]]}},"container-title":["2024 IEEE 42nd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10538470\/10538498\/10538659.pdf?arnumber=10538659","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,30]],"date-time":"2024-05-30T09:03:35Z","timestamp":1717059815000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10538659\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,22]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/vts60656.2024.10538659","relation":{},"subject":[],"published":{"date-parts":[[2024,4,22]]}}}