{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,30]],"date-time":"2026-03-30T21:53:48Z","timestamp":1774907628629,"version":"3.50.1"},"reference-count":34,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,22]]},"DOI":"10.1109\/vts60656.2024.10538672","type":"proceedings-article","created":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T17:24:14Z","timestamp":1717003454000},"page":"1-7","source":"Crossref","is-referenced-by-count":4,"title":["Structural Built In Self Test of Analog Circuits using ON\/OFF Keying and Delay Monitors"],"prefix":"10.1109","author":[{"given":"Suhas Krishna","family":"Kashyap","sequence":"first","affiliation":[{"name":"Arizona State University,Department of ECEE,Tempe,AZ"}]},{"given":"Chinmaye","family":"Raghavendra","sequence":"additional","affiliation":[{"name":"Arizona State University,Department of ECEE,Tempe,AZ"}]},{"given":"Suriyaprakash","family":"Natarajan","sequence":"additional","affiliation":[{"name":"Design Engineering Group Intel Corporation,Santa Clara,CA"}]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[{"name":"Arizona State University,Department of ECEE,Tempe,AZ"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"An introduction to mixed-signal IC test and measurement","volume":"2001","author":"Burns","year":"2001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242033"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791533"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131577"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3152157"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3067180"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-ASIA.2017.8097102"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2045542"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.44"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.87"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299252"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IMS30576.2020.9224039"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2019.2902712"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2781369"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766670"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1344418.1344429"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.125"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS52500.2021.9794141"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131581"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523653"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805831"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457075"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2023.3257641"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699272"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990307"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2159055"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1996.489490"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894324"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1009910"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2002.1016891"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5214-y"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2023.3266997"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3427911"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2739479"}],"event":{"name":"2024 IEEE 42nd VLSI Test Symposium (VTS)","location":"Tempe, AZ, USA","start":{"date-parts":[[2024,4,22]]},"end":{"date-parts":[[2024,4,24]]}},"container-title":["2024 IEEE 42nd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10538470\/10538498\/10538672.pdf?arnumber=10538672","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,30]],"date-time":"2024-05-30T09:14:10Z","timestamp":1717060450000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10538672\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,22]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/vts60656.2024.10538672","relation":{},"subject":[],"published":{"date-parts":[[2024,4,22]]}}}