{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T18:21:53Z","timestamp":1769538113542,"version":"3.49.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,22]]},"DOI":"10.1109\/vts60656.2024.10538681","type":"proceedings-article","created":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T13:24:14Z","timestamp":1716989054000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Millimeter-wave and THz Measurement Practices"],"prefix":"10.1109","author":[{"given":"Saeed","family":"Zeinolabedinzadeh","sequence":"first","affiliation":[{"name":"Arizona State University,School of Electrical, Computer, and Energy Engineering,Tempe,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2420597"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG57476.2023.10278758"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SIRF.2019.8709094"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2014.6848559"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SIRF46766.2020.9040189"}],"event":{"name":"2024 IEEE 42nd VLSI Test Symposium (VTS)","location":"Tempe, AZ, USA","start":{"date-parts":[[2024,4,22]]},"end":{"date-parts":[[2024,4,24]]}},"container-title":["2024 IEEE 42nd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10538470\/10538498\/10538681.pdf?arnumber=10538681","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T04:35:03Z","timestamp":1769488503000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10538681\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,22]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/vts60656.2024.10538681","relation":{},"subject":[],"published":{"date-parts":[[2024,4,22]]}}}