{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T03:03:56Z","timestamp":1725764636062},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,22]],"date-time":"2024-04-22T00:00:00Z","timestamp":1713744000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,22]]},"DOI":"10.1109\/vts60656.2024.10538823","type":"proceedings-article","created":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T17:24:14Z","timestamp":1717003454000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Sequential Decoders for Binary Linear Block ECCs"],"prefix":"10.1109","author":[{"given":"Valentin","family":"Gherman","sequence":"first","affiliation":[{"name":"Université Grenoble Alpes,CEA, List,Grenoble,France,F-38000"}]},{"given":"Cyrille","family":"Laffond","sequence":"additional","affiliation":[{"name":"Université Grenoble Alpes,CEA, List,Grenoble,France,F-38000"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/sips.2012.11"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/imw56887.2023.10145984"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1186\/1687-6180-2012-211"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/hpca.2015.7056062"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1007\/978-90-481-9431-5"},{"key":"ref6","article-title":"Beyond capacity: storage architecture choices for the modern datacenter","author":"Sundby","year":"2014","journal-title":"White Paper, IDC Analyze the Future"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/tit.1965.1053833"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/mst.2016.16"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.30420\/454862002"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/26.120156"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/tcsii.2012.2208678"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1147\/rd.144.0395"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/dac.1990.114954"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/tcad.1987.1270347"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/s0924-6509(08)x7030-8"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/s0019-9958(60)90287-4"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1002\/0471792748"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1147\/rd.282.0124"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/tit.1960.1057586"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1007\/978-1-4613-2821-6"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/iccad.2001.968667"},{"author":"Somenzi","journal-title":"Release 2.5.1","article-title":"CUDD: CU Decision Diagram Package","key":"ref23"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1145\/1228784.1228856"},{"year":"2011","journal-title":"JESD218A","article-title":"Solid-state drive (SSD) requirements and endurance test method","key":"ref25"}],"event":{"name":"2024 IEEE 42nd VLSI Test Symposium (VTS)","start":{"date-parts":[[2024,4,22]]},"location":"Tempe, AZ, USA","end":{"date-parts":[[2024,4,24]]}},"container-title":["2024 IEEE 42nd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10538470\/10538498\/10538823.pdf?arnumber=10538823","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,30]],"date-time":"2024-05-30T11:03:19Z","timestamp":1717066999000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10538823\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,22]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/vts60656.2024.10538823","relation":{},"subject":[],"published":{"date-parts":[[2024,4,22]]}}}