{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T16:30:50Z","timestamp":1783787450148,"version":"3.55.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,4,28]],"date-time":"2025-04-28T00:00:00Z","timestamp":1745798400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,28]],"date-time":"2025-04-28T00:00:00Z","timestamp":1745798400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,4,28]]},"DOI":"10.1109\/vts65138.2025.11022822","type":"proceedings-article","created":{"date-parts":[[2025,6,10]],"date-time":"2025-06-10T17:48:39Z","timestamp":1749577719000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Periodic Non-Destructive Memory BIST for Automotive Applications"],"prefix":"10.1109","author":[{"given":"Wei","family":"Zou","sequence":"first","affiliation":[{"name":"Siemens EDA,Wilsonville,OR,United States"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Artur","family":"Pogiel","sequence":"additional","affiliation":[{"name":"Siemens EDA,Poznań,Poland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Albert","family":"Au","sequence":"additional","affiliation":[{"name":"Siemens EDA,Ottawa,Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Martin","family":"Keim","sequence":"additional","affiliation":[{"name":"Siemens EDA,Orlando,FL,United States"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","year":"2018","journal-title":"ISO 26262: Road Vehicles - Functional Safety"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/54.922800"},{"key":"ref3","volume-title":"High Performance Memory Testing \u2013 Design Principles, Fault Modeling and Self-Test","author":"Dean Adams","year":"2003"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966638"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527880"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/e23070894"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477287"},{"key":"ref8","year":"2014","journal-title":"Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device"},{"key":"ref9","article-title":"Memory BIST for Shared-Bus applications","author":"Press","year":"2012","journal-title":"Test and Measurement World"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ITC51657.2024.00050"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ITC51657.2024.00017"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2008.4802502"}],"event":{"name":"2025 IEEE 43rd VLSI Test Symposium (VTS)","location":"Tempe, AZ, USA","start":{"date-parts":[[2025,4,28]]},"end":{"date-parts":[[2025,4,30]]}},"container-title":["2025 IEEE 43rd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11022705\/11022774\/11022822.pdf?arnumber=11022822","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:20:07Z","timestamp":1749619207000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11022822\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,28]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/vts65138.2025.11022822","relation":{},"subject":[],"published":{"date-parts":[[2025,4,28]]}}}