{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,27]],"date-time":"2026-06-27T16:24:28Z","timestamp":1782577468478,"version":"3.54.5"},"reference-count":47,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,4,28]],"date-time":"2025-04-28T00:00:00Z","timestamp":1745798400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,28]],"date-time":"2025-04-28T00:00:00Z","timestamp":1745798400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,4,28]]},"DOI":"10.1109\/vts65138.2025.11022867","type":"proceedings-article","created":{"date-parts":[[2025,6,10]],"date-time":"2025-06-10T17:48:39Z","timestamp":1749577719000},"page":"1-11","source":"Crossref","is-referenced-by-count":2,"title":["Silent Data Corruption: Advancing Detection, Diagnosis, and Mitigation Strategies"],"prefix":"10.1109","author":[{"given":"Peter","family":"Domanski","sequence":"first","affiliation":[{"name":"Arizona State University,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mukarram Ali","family":"Faridi","sequence":"additional","affiliation":[{"name":"Auburn University,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gabriel","family":"Kaunang","sequence":"additional","affiliation":[{"name":"University of Chicago,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wilson","family":"Pradeep","sequence":"additional","affiliation":[{"name":"Google LLC,Mountain View,CA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Adit","family":"Singh","sequence":"additional","affiliation":[{"name":"Auburn University,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Muhammad Alfian","family":"Amrizal","sequence":"additional","affiliation":[{"name":"Universitas Gadjah Mada,Indonesia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yanjing","family":"Li","sequence":"additional","affiliation":[{"name":"University of Chicago,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Farshad","family":"Firouzi","sequence":"additional","affiliation":[{"name":"Arizona State University,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"Arizona State University,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2008.4630077"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2172\/1222713"},{"key":"ref3","article-title":"Detection and prevention of silent data corruption in an exabyte-scale database system","volume-title":"The 18th IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE)","author":"Bacon"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iolts59296.2023.10224872"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3458336.3465297"},{"key":"ref6","article-title":"Detecting silent data corruptions in the wild","author":"Dixit","year":"2022"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48228.2024.10529392"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48228.2024.10529375"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CLUSTER.2018.00035"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2905842"},{"key":"ref11","article-title":"Training in turmoil: Silent data corruption in systems at scale","volume-title":"International Test Conference Silicon Lifecycle Management Workshop","author":"Bonderson"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818798"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICJECE.2022.3189043"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484786"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469571"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS60994.2024.10616056"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567054"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2323216"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.261012"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00083"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000173"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA59077.2024.00045"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00046"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270315"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2015.7223657"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567054"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"ref28","article-title":"16nm hp process model","author":"Krishnapura"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624906"},{"key":"ref30","first-page":"469","article-title":"Mcpat: An integrated power, area, and timing modeling framework for multicore and manycore architectures","volume-title":"Proceedings of the 42nd annual ieee\/acm international symposium on microarchitecture","author":"Li"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2023.3285094"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2024716.2024718"},{"key":"ref33","first-page":"7","article-title":"SonicBOOM: The 3rd Generation Berkeley Out-of-Order Machine","volume-title":"Fourth Workshop on Computer Architecture Research with RISC-V","author":"Zhao"},{"key":"ref34","article-title":"core-v-verif","year":"2025"},{"key":"ref35","first-page":"1","article-title":"IEEE standard for universal verification methodology language reference manual","year":"2020","journal-title":"IEEE Std 1800.2-2020 (Revision of IEEE Std 1800.2-2017)"},{"key":"ref36","article-title":"In-datacenter performance analysis of a tensor processing unit","volume-title":"CoRR","volume":"abs\/1704.04760","author":"Jouppi","year":"2017"},{"key":"ref37","article-title":"End to end learning for self-driving cars","author":"Bojarski","year":"2016"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00286"},{"key":"ref39","first-page":"8:1","article-title":"Understanding error propagation in deep learning neural network (dnn) accelerators and applications","volume-title":"Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis","author":"Li"},{"key":"ref40","article-title":"Iso 26262-1:2018 road vehicles \u2013 functional safety","year":"2018"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO50266.2020.00033"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W50199.2020.00014"},{"key":"ref43","doi-asserted-by":"crossref","DOI":"10.1109\/ISSRE5003.2020.00047","article-title":"Tensorfi: A flexible fault injection framework for tensorflow applications","author":"Chen","year":"2020"},{"key":"ref44","article-title":"Onnx runtime","author":"developers","year":"2021"},{"key":"ref45","article-title":"Nvdla open source project","year":"2018"},{"key":"ref46","article-title":"A white paper on neural network quantization","author":"Nagel","year":"2021"},{"key":"ref47","first-page":"1796","article-title":"Ultra-low precision 4-bit training of deep neural networks","volume":"33","author":"Sun","year":"2020","journal-title":"Advances in Neural Information Processing Systems"}],"event":{"name":"2025 IEEE 43rd VLSI Test Symposium (VTS)","location":"Tempe, AZ, USA","start":{"date-parts":[[2025,4,28]]},"end":{"date-parts":[[2025,4,30]]}},"container-title":["2025 IEEE 43rd VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11022705\/11022774\/11022867.pdf?arnumber=11022867","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:10:48Z","timestamp":1749618648000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11022867\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,28]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/vts65138.2025.11022867","relation":{},"subject":[],"published":{"date-parts":[[2025,4,28]]}}}