{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:52:30Z","timestamp":1781848350359,"version":"3.54.5"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020950","name":"National Science and Technology Council","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100020950","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,27]]},"DOI":"10.1109\/vts69484.2026.11563213","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:49Z","timestamp":1781813209000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["Late Breaking Results \u2013 Confidence-Gap\u2013Driven Functional Test Pattern Generation for Enhancing Functional Safety of CNN Accelerators"],"prefix":"10.1109","author":[{"given":"Tong-Yu","family":"Hsieh","sequence":"first","affiliation":[{"name":"National Sun Yat-sen University,Department of Electrical Engineering,Kaohsiung,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ching-Hsin","family":"Hsu","sequence":"additional","affiliation":[{"name":"National Sun Yat-sen University,Department of Electrical Engineering,Kaohsiung,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wei-Ji","family":"Chao","sequence":"additional","affiliation":[{"name":"National Sun Yat-sen University,Department of Electrical Engineering,Kaohsiung,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080246"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3048829"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2023.3241218"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368656"},{"key":"ref5","article-title":"PyTorch-cDCGAN-MNIST","author":"Jiezou","year":"2020"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3446374"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465834"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714885"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3453688.3461750"}],"event":{"name":"2026 IEEE 44th VLSI Test Symposium (VTS)","location":"Napa, CA, USA","start":{"date-parts":[[2026,4,27]]},"end":{"date-parts":[[2026,4,29]]}},"container-title":["2026 IEEE 44th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11563061\/11563198\/11563213.pdf?arnumber=11563213","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:22:35Z","timestamp":1781846555000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11563213\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,27]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/vts69484.2026.11563213","relation":{},"subject":[],"published":{"date-parts":[[2026,4,27]]}}}