{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T06:50:35Z","timestamp":1781851835386,"version":"3.54.5"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,27]]},"DOI":"10.1109\/vts69484.2026.11563368","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:49Z","timestamp":1781813209000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Coverage-Aware Scan-Chain Reordering Under Iso-Power Constraints for Programmable Low-Power LBIST"],"prefix":"10.1109","author":[{"given":"Yumei","family":"Hu","sequence":"first","affiliation":[{"name":"Huazhong University of Science and Technology,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hairui","family":"Cai","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiangheng","family":"Xie","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhipeng","family":"Lv","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhouxing","family":"Su","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yaning","family":"Wang","sequence":"additional","affiliation":[{"name":"Huawei Technologies Co., Ltd,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yu","family":"Huang","sequence":"additional","affiliation":[{"name":"Huawei Technologies Co., Ltd,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zezhong","family":"Wang","sequence":"additional","affiliation":[{"name":"Huawei Technologies Co., Ltd,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xing","family":"Wang","sequence":"additional","affiliation":[{"name":"Huawei Technologies Co., Ltd,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242036"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2018.8400707"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000115"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297695"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2005.251733"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/SmartTechCon.2017.8358474"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.870861"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477314"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805826"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2704104"},{"key":"ref11","first-page":"261","volume-title":"A low-complexity scan reordering algorithm for low power test-per-scan bist","volume":"7","author":"Debjyoti Ghosh","year":"2001"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5507-7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3457795"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICOEI.2019.8862789"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC56007.2022.10031357"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2015.8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MLCAD55463.2022.9900094"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2025.3581296"},{"issue":"18","key":"ref19","doi-asserted-by":"crossref","DOI":"10.3390\/s21186111","article-title":"Low-power scan correlation-aware scan cluster reordering for wireless sensor networks","volume":"21","author":"Lee","year":"2021","journal-title":"Sensors"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2294712"}],"event":{"name":"2026 IEEE 44th VLSI Test Symposium (VTS)","location":"Napa, CA, USA","start":{"date-parts":[[2026,4,27]]},"end":{"date-parts":[[2026,4,29]]}},"container-title":["2026 IEEE 44th VLSI Test Symposium (VTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11563061\/11563198\/11563368.pdf?arnumber=11563368","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:51:16Z","timestamp":1781848276000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11563368\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,27]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/vts69484.2026.11563368","relation":{},"subject":[],"published":{"date-parts":[[2026,4,27]]}}}