{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,14]],"date-time":"2025-05-14T14:47:13Z","timestamp":1747234033220},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/wsc.2002.1166479","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T21:03:42Z","timestamp":1056575022000},"page":"1857-1861","source":"Crossref","is-referenced-by-count":33,"title":["Using simulation-based scheduling to maximize demand fulfillment in a semiconductor assembly facility"],"prefix":"10.1109","volume":"2","author":[{"given":"J.","family":"Potoradi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ong Siong Boon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.J.","family":"Mason","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Semiconductor Devices Physics and Technology","year":"1985","author":"sze","key":"ref4"},{"journal-title":"Factory physics foundation of manufacturing management Chicago Irwin","year":"1996","author":"hopp","key":"ref3"},{"journal-title":"Factory Explorer&#x2122 Users Guide","year":"1996","author":"chance","key":"ref2"},{"key":"ref1","first-page":"159","article-title":"No Cost Applications For Assembly Cycle Time Reduction","author":"brown","year":"1999","journal-title":"International Conference on Semiconductor Manufacturing Operational Modeling and Simulation"}],"event":{"name":"2002 Winter Simulation Conference","acronym":"WSC-02","location":"San Diego, CA, USA"},"container-title":["Proceedings of the Winter Simulation Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8343\/26292\/01166479.pdf?arnumber=1166479","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T18:38:28Z","timestamp":1489430308000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1166479\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/wsc.2002.1166479","relation":{},"subject":[]}}