{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T07:29:55Z","timestamp":1722929395979},"reference-count":2,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/wsc.2002.1172991","type":"proceedings-article","created":{"date-parts":[[2003,6,26]],"date-time":"2003-06-26T01:03:42Z","timestamp":1056589422000},"page":"993-998","source":"Crossref","is-referenced-by-count":4,"title":["Simulation-based analysis of a complex printed circuit board testing process"],"prefix":"10.1109","volume":"1","author":[{"given":"J.S.","family":"Smith","sequence":"first","affiliation":[]},{"family":"Yali Li","sequence":"additional","affiliation":[]},{"given":"J.","family":"Gjesvold","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Introduction to Simulation Using SIMAN","year":"1995","author":"pegden","key":"ref2"},{"journal-title":"Discrete-Event System Simulation","year":"2001","author":"banks","key":"ref1"}],"event":{"name":"2002 Winter Simulation Conference","acronym":"WSC-02","location":"San Diego, CA, USA"},"container-title":["Proceedings of the Winter Simulation Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8343\/26360\/01172991.pdf?arnumber=1172991","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:22:51Z","timestamp":1489443771000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1172991\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/wsc.2002.1172991","relation":{},"subject":[]}}