{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T13:19:37Z","timestamp":1762521577004,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1109\/wsc.2012.6464988","type":"proceedings-article","created":{"date-parts":[[2013,3,1]],"date-time":"2013-03-01T13:24:26Z","timestamp":1362144266000},"page":"1-12","source":"Crossref","is-referenced-by-count":7,"title":["Wip control and calibration in a wafer fab"],"prefix":"10.1109","author":[{"given":"Zhugen","family":"Zhou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oliver","family":"Rose","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","article-title":"Measurement and Improvement of Manufacturing Capacities (MIMAC): Final report","author":"fowler","year":"1995","journal-title":"Technical Report 95062861A-TR SEMATECH Austin TX"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2003.815201"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1080\/05695558108974544"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2010.5678947"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/66.484296"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1287\/inte.32.1.61.15"},{"key":"4","first-page":"409","article-title":"Standard wip determination and wip balance control with time constraints in semiconductor wafer fabrication","volume":"15","author":"kuo","year":"2008","journal-title":"Journal of Quality"}],"event":{"name":"2012 Winter Simulation Conference - (WSC 2012)","start":{"date-parts":[[2012,12,9]]},"location":"Berlin, Germany","end":{"date-parts":[[2012,12,12]]}},"container-title":["Proceedings Title: Proceedings of the 2012 Winter Simulation Conference (WSC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6451330\/6464965\/06464988.pdf?arnumber=6464988","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T17:28:13Z","timestamp":1490203693000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6464988\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/wsc.2012.6464988","relation":{},"subject":[],"published":{"date-parts":[[2012,12]]}}}