{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T16:37:03Z","timestamp":1730306223670,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1109\/wsc.2012.6465071","type":"proceedings-article","created":{"date-parts":[[2013,3,1]],"date-time":"2013-03-01T08:24:26Z","timestamp":1362126266000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Optimized inspection capacity for out of control detection in semiconductor manufacturing"],"prefix":"10.1109","author":[{"given":"Israel","family":"Tirkel","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(01)00197-7"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2008.4736303"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2009.2031779"},{"key":"16","article-title":"The relationship between yield and flow time in a production system under inspection","author":"tirkel","year":"2011","journal-title":"International Journal of Production Research"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2003.815897"},{"journal-title":"Strategies for Manufacturing Low Volume Semiconductor Products in High Volume Manufacturing Environment","year":"2002","author":"scholtz iii","key":"14"},{"journal-title":"Production and Operations Analysis","year":"2009","author":"nahmias","key":"11"},{"journal-title":"SEMI STANDARDS","article-title":"Guide to calculate cost of ownership (COO) metrics for semiconductor manufacturing equipment","year":"1995","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2008.4529042"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.2307\/2281343"},{"key":"1","first-page":"17","article-title":"Activity based budgeting at digital semiconductor","author":"block","year":"1999","journal-title":"International Journal of Strategic Cost Management"},{"journal-title":"Introduction to Statistical Quality Control","year":"2009","author":"montgomery","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1080\/07408170500327352"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2006.08.060"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/66.999603"},{"key":"4","first-page":"119","article-title":"Using an optimized queueing network model to support wafer fab design","volume":"34","author":"hopp","year":"2002","journal-title":"IIE Transactions (Institute of Industrial Engineers)"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2002.1001629"},{"key":"8","article-title":"Line defect control to maximize yields","volume":"4","author":"mittal","year":"1998","journal-title":"Intel Technology Journal"}],"event":{"name":"2012 Winter Simulation Conference - (WSC 2012)","start":{"date-parts":[[2012,12,9]]},"location":"Berlin, Germany","end":{"date-parts":[[2012,12,12]]}},"container-title":["Proceedings Title: Proceedings of the 2012 Winter Simulation Conference (WSC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6451330\/6464965\/06465071.pdf?arnumber=6465071","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T14:59:40Z","timestamp":1490194780000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6465071\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/wsc.2012.6465071","relation":{},"subject":[],"published":{"date-parts":[[2012,12]]}}}