{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T16:07:19Z","timestamp":1778947639728,"version":"3.51.4"},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/wsc.2014.7020067","type":"proceedings-article","created":{"date-parts":[[2015,1,27]],"date-time":"2015-01-27T15:30:56Z","timestamp":1422372656000},"page":"2239-2250","source":"Crossref","is-referenced-by-count":8,"title":["A step toward capacity planning at finite capacity in semiconductor manufacturing"],"prefix":"10.1109","author":[{"given":"Emna","family":"Mhiri","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mireille","family":"Jacomino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabien","family":"Mangione","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Vialletelle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guillaume","family":"Lepelletier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","author":"vollmann","year":"2005","journal-title":"Manufacturing Planning and Control Systems for Supply Chain Management"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/07408179408966627"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/09537280600900733"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2007.4341734"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2008.4736328"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1080\/00207540010010253"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/66.492820"},{"key":"ref15","first-page":"41","article-title":"Fab Simulation and Variability","volume":"41","author":"ignizio","year":"2012","journal-title":"Future Fab International"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/07408179208964234"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1287\/inte.26.1.6"},{"key":"ref18","article-title":"The Engineering Management of Speed","author":"leachman","year":"2012","journal-title":"Proceedings of the 2012 Industry Studies Association Annual Conference"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.1990.111212"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1287\/inte.20.1.43"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2004.12.003"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-0136(00)00724-X"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0305-0548(02)00075-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/00207540802007597"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"47","DOI":"10.1080\/07408179208964233","article-title":"A review of production planning and scheduling models in the semiconductor industry part I: system characteristics, performance evaluation and production planning","volume":"24","author":"uzsoy","year":"1992","journal-title":"IIE Transactions"},{"key":"ref5","first-page":"1310","article-title":"Finite capacity requirements planning with equipment capability and dedication for semiconductor manufacturing","author":"chen","year":"2008","journal-title":"Proceedings of the 9th Asia Pacific Industrial Engineering & Management Systems Conference"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00207549108930094"},{"key":"ref7","author":"goldratt","year":"1990","journal-title":"Theory of Constraints What is this thing called Theory of Constraints and how should it be implemented Croton-on-Hudson"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0925-5273(92)90058-F"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11465-008-0083-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1287\/inte.29.5.31"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2011.6148055"},{"key":"ref22","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4614-4472-5","author":"m\u00f6nch","year":"2013","journal-title":"Production Planning and Control for Semiconductor Wafer Fabrication Facilities Modeling Analysis and Systems Springer"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10951-010-0222-9"},{"key":"ref24","first-page":"1592","article-title":"A Model for Master Planning in Semiconductor Manufacturing","author":"ponsignon","year":"2008","journal-title":"Proceedings of the 2008 Industrial Engineering Research Conference"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.cor.2011.06.009"},{"key":"ref26","first-page":"1","article-title":"Evolution of manufacturing planning and control systems: from reorder point to enterprise resource planning","volume":"42","author":"rondeau","year":"2001","journal-title":"Production and Inventory Management Journal"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.1998.745804"}],"event":{"name":"2014 Winter Simulation Conference - (WSC 2014)","location":"Savanah, GA, USA","start":{"date-parts":[[2014,12,7]]},"end":{"date-parts":[[2014,12,10]]}},"container-title":["Proceedings of the Winter Simulation Conference 2014"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7002492\/7019868\/07020067.pdf?arnumber=7020067","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T04:25:41Z","timestamp":1498191941000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7020067\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/wsc.2014.7020067","relation":{},"subject":[],"published":{"date-parts":[[2014,12]]}}}