{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T04:15:26Z","timestamp":1773720926627,"version":"3.50.1"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,12,14]],"date-time":"2020-12-14T00:00:00Z","timestamp":1607904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,12,14]],"date-time":"2020-12-14T00:00:00Z","timestamp":1607904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,12,14]],"date-time":"2020-12-14T00:00:00Z","timestamp":1607904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003032","name":"Association Nationale de la Recherche et de la Technologie","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003032","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,12,14]]},"DOI":"10.1109\/wsc48552.2020.9384001","type":"proceedings-article","created":{"date-parts":[[2021,3,29]],"date-time":"2021-03-29T22:03:21Z","timestamp":1617055401000},"page":"1886-1897","source":"Crossref","is-referenced-by-count":5,"title":["Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing"],"prefix":"10.1109","author":[{"given":"Etienne","family":"Le Quere","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephane","family":"Dauzere-Peres","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Karim","family":"Tamssaouet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cedric","family":"Maufront","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephane","family":"Astie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"coin-or\/Cbc: Version 2.10.5","author":"forrest","year":"2020"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2469\/faj.v60.n6.2669"},{"key":"ref12","author":"jorion","year":"2007","journal-title":"Value at Risk The New Benchmark for Managing Financial Risk"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.907609"},{"key":"ref14","doi-asserted-by":"crossref","DOI":"10.1017\/CBO9781139177801.004","article-title":"Submodular function maximization","author":"krause","year":"2014"},{"key":"ref15","first-page":"1","article-title":"Industrial implementation of a dynamic sampling algorithm in semiconductor manufacturing: Approach and challenges","author":"nduhura-munga","year":"2012","journal-title":"Proceedings of the 2012 Winter Simulation Conference (WSC)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2013.2256943"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/BF01588971"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.21314\/JOR.2000.038"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2013.6721729"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0166-218X(84)90003-9"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2009.2028215"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2010.5551470"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1287\/mnsc.23.8.789"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/BF01584082"},{"key":"ref7","first-page":"69","article-title":"Submodular functions, matroids, and certain polyhedra","author":"edmonds","year":"1970","journal-title":"Combinatorial Structures and Their Applications"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.omega.2015.07.012"},{"key":"ref1","article-title":"Variation reduction in a wafer fabrication line through inspection optimization","author":"bean","year":"2008"},{"key":"ref9","author":"feigenbaum","year":"1951","journal-title":"Quality control Principles practice and administration An industrial management tool for improving product quality and design and for reducing operating costs and losses"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2015.7408397"},{"key":"ref22","article-title":"A New Approximation Guarantee for Monotone Submodular Function Maximization via Discrete Convexity","author":"soma","year":"2017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2010.5717225"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-6377(03)00062-2"}],"event":{"name":"2020 Winter Simulation Conference (WSC)","location":"Orlando, FL, USA","start":{"date-parts":[[2020,12,14]]},"end":{"date-parts":[[2020,12,18]]}},"container-title":["2020 Winter Simulation Conference (WSC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9383852\/9383853\/09384001.pdf?arnumber=9384001","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,22]],"date-time":"2022-12-22T20:44:51Z","timestamp":1671741891000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9384001\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12,14]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/wsc48552.2020.9384001","relation":{},"subject":[],"published":{"date-parts":[[2020,12,14]]}}}