{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,27]],"date-time":"2026-09-27T10:18:45Z","timestamp":1790504325949,"version":"4.1.0"},"reference-count":8,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[1978,4,1]],"date-time":"1978-04-01T00:00:00Z","timestamp":260236800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer"],"published-print":{"date-parts":[[1978,4]]},"DOI":"10.1109\/c-m.1978.218136","type":"journal-article","created":{"date-parts":[[2007,7,12]],"date-time":"2007-07-12T16:49:31Z","timestamp":1184258971000},"page":"34-41","source":"Crossref","is-referenced-by-count":1506,"title":["Hints on Test Data Selection: Help for the Practicing Programmer"],"prefix":"10.1109","volume":"11","author":[{"given":"R.A.","family":"DeMillo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"R.J.","family":"Lipton","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"F.G.","family":"Sayward","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","author":"youngs","year":"1971","journal-title":"Error-Proneness in Programming"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/800027.808473"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233835"},{"key":"ref5","article-title":"the design of a prototype mutation system for program testing","author":"budd","year":"0","journal-title":"Proc 1978 NCC"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/800027.808445"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SC.2006.40"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/512950.512970"},{"key":"ref1","author":"tucker","year":"1965","journal-title":"The Correlation of Computer Program Quality with Testing Effort"}],"container-title":["Computer"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/2\/34533\/01646911.pdf?arnumber=1646911","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:27:59Z","timestamp":1641986879000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1646911\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1978,4]]},"references-count":8,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/c-m.1978.218136","relation":{},"ISSN":["0018-9162"],"issn-type":[{"value":"0018-9162","type":"print"}],"subject":[],"published":{"date-parts":[[1978,4]]}}}