{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,11]],"date-time":"2025-11-11T05:59:00Z","timestamp":1762840740410,"version":"build-2065373602"},"reference-count":77,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"National Funds through Funda\u00e7\u00e3o para a Ci\u00eancia e a Tecnologia"},{"name":"Project SECURE-Physically Unclonable Circuits for Secure Digital Systems Using Hybrid Technologies Printed Electronics and CMOS and Center of Technology and Systems (CTS) Multiannual Funding Program","award":["2024.16986.PEX","CTS\/00066"],"award-info":[{"award-number":["2024.16986.PEX","CTS\/00066"]}]},{"name":"Lisbon 2030 Program","award":["LISBOA2030-FEDER-00816400"],"award-info":[{"award-number":["LISBOA2030-FEDER-00816400"]}]},{"DOI":"10.13039\/501100008530","name":"European Union though the European Regional Development Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100008530","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2025.3629328","type":"journal-article","created":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T18:41:15Z","timestamp":1762368075000},"page":"189959-189978","source":"Crossref","is-referenced-by-count":0,"title":["Revisiting ZTC and GZTC in CMOS FinFET Using a Five-DC-Parameter MOSFET Model"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-0753-4070","authenticated-orcid":false,"given":"Miguel","family":"Coelho","sequence":"first","affiliation":[{"name":"Faculty of Sciences of the University of Lisbon, Lisbon, Portugal"}]},{"given":"Pedro","family":"Toledo","sequence":"additional","affiliation":[{"name":"Synopsys, Dublin 15, Ireland"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-7991-9505","authenticated-orcid":false,"given":"Rafael","family":"Martins","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering (DEEC), NOVA School of Science and Technology, Center of Technology and Systems (CTS-UNINOVA), Associated Laboratory of Intelligent Systems (LASI), Lisbon, Portugal"}]},{"given":"Alexandra","family":"Matos","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering (DEEC), NOVA School of Science and Technology, Center of Technology and Systems (CTS-UNINOVA), Associated Laboratory of Intelligent Systems (LASI), Lisbon, Portugal"}]},{"given":"Rafael","family":"Ferreira","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering (DEEC), NOVA School of Science and Technology, Center of Technology and Systems (CTS-UNINOVA), Associated Laboratory of Intelligent Systems (LASI), Lisbon, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9043-6980","authenticated-orcid":false,"given":"Boyapati","family":"Subrahmanyam","sequence":"additional","affiliation":[{"name":"Synopsys, Dublin 15, Ireland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0624-1775","authenticated-orcid":false,"given":"Luis B.","family":"Oliveira","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering (DEEC), NOVA School of Science and Technology, Center of Technology and Systems (CTS-UNINOVA), Associated Laboratory of Intelligent Systems (LASI), Lisbon, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5869-7950","authenticated-orcid":false,"given":"Jos\u00e9 Soares","family":"Augusto","sequence":"additional","affiliation":[{"name":"Faculty of Sciences of the University of Lisbon, Lisbon, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3396-4634","authenticated-orcid":false,"given":"Jo\u00e3o P.","family":"Oliveira","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering (DEEC), NOVA School of Science and Technology, Center of Technology and Systems (CTS-UNINOVA), Associated Laboratory of Intelligent Systems (LASI), Lisbon, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2692-9371","authenticated-orcid":false,"given":"Hamilton D.","family":"Klimach","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Microelectronics Graduate Program, Federal University of Rio Grande do Sul, Porto Alegre, Brazil"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2262713"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/81.933328"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2009.5236161"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2006.01.008"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1149\/1.2956038"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1328343"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.29292\/jics.v10i2.411"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2298\/FUEE1503393M"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ccece.2015.7129173"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.mssp.2014.11.036"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2016.7999041"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/icecs.2017.8291999"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2019.104658"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LAEDC51812.2021.9437935"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3234897"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202400089"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2021.105277"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/37\/6\/064011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/S3S.2017.8309258"},{"article-title":"Zero temperature coefficient behavior for diamond MOSFET","volume-title":"Proc. 20th SForum","author":"Jorge","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1149\/1.2728862"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1149\/1.3474183"},{"key":"ref23","first-page":"119","article-title":"The temperature mobility degradation influence on the ZTC of PD and FD SOI MOSFETs","volume-title":"Proc.-Electrochem. Soc.","author":"Camillo"},{"key":"ref24","first-page":"1","article-title":"CMOS transconductor analysis for low temperature sensitivity based on ZTC MOSFET condition","volume-title":"Proc. 28th Symp. Integr. Circuits Syst. Design","author":"Toledo"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/sbcci.2016.7724075"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.29292\/jics.v11i1.427"},{"article-title":"MOSFET zero-temperature-coefficient (ZTC) effect modeling and analysis for low thermal sensitivity analog applications","year":"2015","author":"Toledo","key":"ref27"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2007.4488716"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2057404"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2012.6330659"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/SBMicro.2017.8113016"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3215097"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.2298\/FUEE1404613M"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3303150"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/SiRF53094.2022.9720052"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2019.8870416"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/SBMICRO55822.2022.9881044"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/SBMicro64348.2024.10673861"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2024.3395413"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/edtm58488.2024.10511407"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/LAEDC61552.2024.10555663"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2024.3502728"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8623863"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3057900"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2023.3344639"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ITC51657.2024.00013"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS60917.2024.10658748"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2017.8094515"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2017.8252532"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050289"},{"article-title":"Design of a temperature independent MOSFET-only current reference","year":"2011","author":"Nukala","key":"ref51"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2017.7974160"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2018.8430368"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2925266"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS46596.2019.8964641"},{"key":"ref56","first-page":"11","article-title":"Low power IEEE 802.11ah receiver system-level design aiming for IoT applications","volume-title":"Proc. 30th Symp. Integr. Circuits Syst. Design, Chip Sands","author":"Andrade"},{"article-title":"System-level analysis for a new SBCD transponder SoC","year":"2015","author":"Negreiros","key":"ref57"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS56072.2025.11043180"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/4.720397"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3417316"},{"volume-title":"Physics of Semiconductor Device","year":"1981","author":"Sze","key":"ref61"},{"volume-title":"Operation and Modeling of the MOS Transistor","year":"2010","author":"Tsividis","key":"ref62"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.2012.6196410"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS57931.2023.10198173"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511803840"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1007\/BF02124750"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3474424"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1975.18267"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1982.1051843"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3198644"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/YEF-ECE58420.2023.10209294"},{"volume-title":"NIST Digital Library of Mathematical Functions:4.13 Lambert Function","year":"2025","key":"ref72"},{"volume-title":"Numerical Analysis","year":"2010","author":"Burden","key":"ref73"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/EDSSC.2005.1635192"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS.2015.7250450"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/4.535416"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-53345-2_11"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6287639\/10820123\/11227104.pdf?arnumber=11227104","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,11]],"date-time":"2025-11-11T05:55:54Z","timestamp":1762840554000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11227104\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":77,"URL":"https:\/\/doi.org\/10.1109\/access.2025.3629328","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2025]]}}}