{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T04:54:27Z","timestamp":1725512067515},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ccece.2004.1347610","type":"proceedings-article","created":{"date-parts":[[2004,11,12]],"date-time":"2004-11-12T19:14:59Z","timestamp":1100286899000},"page":"1975-1979","source":"Crossref","is-referenced-by-count":2,"title":["SDI-12 based turbidity measurement system with field calibration capability"],"prefix":"10.1109","author":[{"given":"J.M.D.","family":"Pereira","sequence":"first","affiliation":[]},{"given":"O.","family":"Postolache","sequence":"additional","affiliation":[]},{"given":"P.S.","family":"Girao","sequence":"additional","affiliation":[]},{"given":"H.","family":"Ramos","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2890-3"},{"journal-title":"Turbidity Measurement","year":"0","key":"11"},{"key":"12","first-page":"529","article-title":"Self organizing maps application in a remote water qaulity monitoring system","author":"postolache","year":"0","journal-title":"Proc IMTC 2003"},{"journal-title":"Turbidity Sensor for Underwater Applications","year":"2001","author":"mylvaganam","key":"3"},{"journal-title":"Measurement instrumentation and sensors","year":"1999","author":"harrison","key":"2"},{"year":"0","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1002\/0470841486"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/SFICON.2002.1159796"},{"journal-title":"Formazine","year":"0","key":"6"},{"journal-title":"Standard Methods for the Examination of Water and Wastewater 20th Edition","year":"1998","author":"clesceri","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2002.1006899"},{"journal-title":"A Serial-digital Interface Standard for Microprocessor-based Sensors Version 1 3","year":"2002","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1201\/NOE0750300582"}],"event":{"name":"Canadian Conference on Electrical and Computer Engineering 2004","acronym":"CCECE-04","location":"Niagara Falls, Ont., Canada"},"container-title":["Canadian Conference on Electrical and Computer Engineering 2004 (IEEE Cat. No.04CH37513)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9317\/29659\/01347610.pdf?arnumber=1347610","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T23:49:11Z","timestamp":1489448951000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1347610\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/ccece.2004.1347610","relation":{},"subject":[]}}