{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T21:57:28Z","timestamp":1729634248815,"version":"3.28.0"},"reference-count":40,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,11]]},"DOI":"10.1109\/dcis.2014.7035596","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T17:21:26Z","timestamp":1423675286000},"page":"1-5","source":"Crossref","is-referenced-by-count":5,"title":["ADC built-in-self-test based on a pseudorandom uniform noise generator"],"prefix":"10.1109","author":[{"given":"Guiomar","family":"Evans","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"545","article-title":"Study of the random noise test of analog-to-digital converters","volume":"xvi","author":"corr\u00eaa","year":"2009","journal-title":"Metrol Meas Syst"},{"journal-title":"IEEE Standard for terminology and test methods for analog-to-digital converters IEEE Std 1241–2010 (Revision of IEEE Std","first-page":"1241","year":"2010","key":"ref38"},{"key":"ref33","first-page":"1192","article-title":"Random Number Generators: Good Ones Are Hard to Find","volume":"3","author":"park","year":"1998","journal-title":"Communications of the ACM"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/272991.272995"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/5.265353"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ReConFig.2009.11"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1214\/aoap\/1177005878"},{"key":"ref36","doi-asserted-by":"crossref","first-page":"1","DOI":"10.18637\/jss.v005.i08","article-title":"The ziggurat method for generating random variables","volume":"5","author":"marsaglia","year":"2000","journal-title":"Journal of Statistical Software"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1287\/opre.50.6.1073.358"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.parco.2004.06.001"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840042"},{"journal-title":"IEEE Standard for digitizing waveform recorders IEEE Std 1057–2007 Institute of Electrical and Electronics Engineers Inc","year":"2008","key":"ref40"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2002.1029644"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICASIC.2003.1277412"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.807415"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2001.929490"},{"key":"ref15","first-page":"213","article-title":"Multi-Histogram ADC BIST System for ADC Linearity Testing","author":"koay","year":"2013","journal-title":"22nd Asian Test Symposium"},{"key":"ref16","first-page":"88","article-title":"Noise sensitivity of the ADC histogram test","author":"carbone","year":"2000","journal-title":"Proc IEEE Instrumentation and Measurement Technology Conference"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2009.5274967"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2015700"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2005.1557347"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2000.873779"},{"key":"ref27","first-page":"67","article-title":"Oscilloscope testing by means of stochastic Signal","volume":"1","author":"vedral","year":"2001","journal-title":"Measurement Science Review"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/19.293454"},{"key":"ref6","first-page":"928","article-title":"An SoC compatible linearity test approach for precious ADCs using easy-to-generate sinusoidal stimuli","volume":"1","author":"jin","year":"2004","journal-title":"Proceedings of the International Symposium on Circuits and Systems"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS.2011.6088996"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260992"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843852"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.392871"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052232"},{"key":"ref9","first-page":"40","article-title":"Linear histogram test of ADCs — A BIST implementation","author":"bernard","year":"2000","journal-title":"Proc IEEE Int l Mixed-Signal Testing Workshop"},{"key":"ref1","article-title":"Dynamic testing and diagnostics of A\/D converters","volume":"cas 33","author":"vanden bossche","year":"1986","journal-title":"IEEE Trans on Circuits and Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1464708"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2006.064"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/19.769631"},{"key":"ref24","first-page":"232","article-title":"New Simple Digital Self-Calibration Algorithm for Pipeline ADCs using the Internal Thermal Noise","author":"figueiredo","year":"2008","journal-title":"ISCAS 2008"},{"key":"ref23","article-title":"1.5 V CMOS Gaussian and uniform noise generators for BISC\/BIST of ADCs","author":"evans","year":"2005","journal-title":"IEEJ International Analog VLSI Workshop"},{"key":"ref26","first-page":"23","article-title":"ADC testing by means of stochastic signal","author":"andrle","year":"2001","journal-title":"Proc European Test Workshop"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2006.382275"}],"event":{"name":"2014 Conference on Design of Circuits and Integrated Systems (DCIS)","start":{"date-parts":[[2014,11,26]]},"location":"Madrid, Spain","end":{"date-parts":[[2014,11,28]]}},"container-title":["Design of Circuits and Integrated Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7011428\/7035524\/07035596.pdf?arnumber=7035596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T01:21:59Z","timestamp":1498180919000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035596\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,11]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/dcis.2014.7035596","relation":{},"subject":[],"published":{"date-parts":[[2014,11]]}}}