{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T10:06:08Z","timestamp":1725617168539},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ddecs.2006.1649607","type":"proceedings-article","created":{"date-parts":[[2006,7,10]],"date-time":"2006-07-10T16:58:00Z","timestamp":1152550680000},"page":"172-177","source":"Crossref","is-referenced-by-count":6,"title":["A Modified Debugging Infrastructure to Assist Real Time Fault Injection Campaigns"],"prefix":"10.1109","author":[{"given":"A.V.","family":"Fidalgo","sequence":"first","affiliation":[]},{"given":"G.R.","family":"Alves","sequence":"additional","affiliation":[]},{"given":"J.M.","family":"Ferreira","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.32"},{"year":"0","key":"13"},{"year":"0","key":"14"},{"year":"0","key":"11"},{"article-title":"CPUGEN 2.00","year":"2003","author":"ferrante","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028916"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966775"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.2"},{"year":"0","key":"10"},{"key":"7","article-title":"Application of Three Physical Fault Injection Techniques to the Experimental Assessment of the MARS Architecture","author":"karlsson","year":"1995","journal-title":"5th IFIP Working Conf Dependable Computing Critical Applications"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1998.689466"},{"key":"5","article-title":"Evaluation of the Thor Microprocessor Using Scan-chain-Based and Simulation Based Fault- Injection","author":"folkesson","year":"1997","journal-title":"8th European Workshop on Dependable Computing"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DCFTS.1999.814299"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2003.1209978"},{"year":"0","key":"8"}],"event":{"name":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","location":"Prague, Czech Republic"},"container-title":["2006 IEEE Design and Diagnostics of Electronic Circuits and systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10974\/34591\/01649607.pdf?arnumber=1649607","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T11:59:07Z","timestamp":1489492747000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1649607\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2006.1649607","relation":{},"subject":[]}}