{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:34:13Z","timestamp":1729622053250,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520552","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["A comparative analysis between genetic algorithms and complex nonlinear least squares on electrical impedance characterization"],"prefix":"10.1109","author":[{"given":"Fernando M.","family":"Janeiro","sequence":"first","affiliation":[]},{"given":"Pedro M.","family":"Ramos","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"2004","author":"haupt","journal-title":"Practical Genetic Algorithms","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/IMTC.2009.5168521"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.electacta.2011.01.047"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TIM.2008.922073"},{"key":"ref14","article-title":"Threshold estimation in least-squares error functions: Application to impedance spectroscopy","author":"janeiro","year":"2013","journal-title":"5 IMEKO Symposium TC4"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1137\/S1052623496303470"},{"key":"ref16","article-title":"Evaluation of Measurement Data - Guide to the Expression of Uncertainty in Measurement","volume":"100","year":"2008","journal-title":"JCGM"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TIM.2007.894170"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1002\/maco.19950460103"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/I2MTC.2014.6860860"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TIM.2012.2224275"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/0022-0728(82)87062-9"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TIM.2008.2005077"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.bioelechem.2008.01.004"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1002\/0471716243"},{"year":"2012","author":"macdonald","journal-title":"LEVM\/LEVMW Version 8 12","key":"ref9"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520552.pdf?arnumber=7520552","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T03:38:52Z","timestamp":1474861132000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520552\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520552","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}