{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T18:20:05Z","timestamp":1763662805475},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,10]]},"DOI":"10.1109\/icsens.2009.5398524","type":"proceedings-article","created":{"date-parts":[[2010,1,26]],"date-time":"2010-01-26T17:37:14Z","timestamp":1264527434000},"source":"Crossref","is-referenced-by-count":16,"title":["GMR based eddy current sensing probe for weld zone testing"],"prefix":"10.1109","author":[{"given":"Octavian","family":"Postolache","sequence":"first","affiliation":[]},{"given":"Helena G.","family":"Ramos","sequence":"additional","affiliation":[]},{"given":"A. Lopes","family":"Ribeiro","sequence":"additional","affiliation":[]},{"given":"F. Correa","family":"Alegria","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"137","article-title":"Virtual Instrument to Detect Defects in Conductive Materials","author":"geirinhas","year":"2009","journal-title":"7th Conference of Telecommunications Santa Maria da Feira"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(02)00075-2"},{"key":"ref12","article-title":"Characterization of Defects in Aluminum Plates Using GMR Probes and Neural Network Signal Processing","author":"postolache","year":"2008","journal-title":"XVI-IMEKO TC4 Symposium"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1080\/09349840109409692"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1051\/epjap:2001002"},{"key":"ref4","article-title":"Investigation of Eddy Current Testing of Weld Zone by Uniform Eddy Current Probe","author":"koyama","year":"0","journal-title":"Proceedings of WCNDT 2000"},{"key":"ref3","first-page":"1447","article-title":"Inductive Probe for Flaw Detection in non-Magnetic Metallic Plates Using Eddy Currents","author":"lopes","year":"2008","journal-title":"Proc I2MTC-IEEE International Instrumentation and Measurement Technology Conference"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2007.02.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-8853(02)00927-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.997819"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-8853(02)01507-X"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547337"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/20.952754"},{"key":"ref9","year":"0","journal-title":"NVE Magnetic Sensor Catalog"}],"event":{"name":"2009 IEEE Sensors","location":"Christchurch","start":{"date-parts":[[2009,10,25]]},"end":{"date-parts":[[2009,10,28]]}},"container-title":["2009 IEEE Sensors"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5379507\/5398121\/05398524.pdf?arnumber=5398524","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T23:39:56Z","timestamp":1489880396000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5398524\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/icsens.2009.5398524","relation":{},"subject":[],"published":{"date-parts":[[2009,10]]}}}