{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T00:25:28Z","timestamp":1768350328645,"version":"3.49.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/icsm.2010.5609747","type":"proceedings-article","created":{"date-parts":[[2010,11,5]],"date-time":"2010-11-05T18:01:44Z","timestamp":1288980104000},"page":"1-10","source":"Crossref","is-referenced-by-count":141,"title":["Deriving metric thresholds from benchmark data"],"prefix":"10.1109","author":[{"given":"Tiago L.","family":"Alves","sequence":"first","affiliation":[]},{"given":"Christiaan","family":"Ypma","sequence":"additional","affiliation":[]},{"given":"Joost","family":"Visser","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","year":"2009","journal-title":"SIG\/TU?ViT Evaluation Criteria - Trusted Product Maintainability"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/SCAM.2003.1238030"},{"key":"18","author":"lokan","year":"2008","journal-title":"The Benchmark Release 10-project Planning Edition"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.1019"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1145\/1391984.1391986"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368140"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2009.5306322"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2002.1000452"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2007.49"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1002\/0471458503"},{"key":"20","year":"2009","journal-title":"R A language and environment for statistical computing R foundation for statistical computing"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2008.16"},{"key":"23","first-page":"35","article-title":"Certification of technical quality of software products","author":"correia","year":"2008","journal-title":"Proc of the Int'l Workshop on Foundations and Techniques for Open Source Software Certification"},{"key":"24","article-title":"Faster defect resolution with higher technical quality of software","author":"luijten","year":"2010","journal-title":"SQM '10 Proc of the 4th International Workshop on Software Quality and Maintainability"},{"key":"25","author":"schwetlick","year":"1995","journal-title":"Least Squares Approximation by Splines with Free Knots"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/336512.336588"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/32.295895"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2000.885858"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/METRIC.1996.492444"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/0164-1212(94)00125-7"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1145\/42372.42379"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/QUATIC.2007.8"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1002\/smr.404"},{"key":"8","article-title":"Establishing software metric thresholds","author":"french","year":"1999","journal-title":"International Workshop on Software Measurement (IWSM'99)"}],"event":{"name":"2010 IEEE 26th International Conference on Software Maintenance (ICSM)","location":"Timi oara, Romania","start":{"date-parts":[[2010,9,12]]},"end":{"date-parts":[[2010,9,18]]}},"container-title":["2010 IEEE International Conference on Software Maintenance"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5604771\/5609528\/05609747.pdf?arnumber=5609747","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T03:04:28Z","timestamp":1490065468000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5609747\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/icsm.2010.5609747","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}