{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,22]],"date-time":"2025-03-22T11:20:11Z","timestamp":1742642411066},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1109\/ims30576.2020.9223802","type":"proceedings-article","created":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T16:01:30Z","timestamp":1602691290000},"page":"428-431","source":"Crossref","is-referenced-by-count":4,"title":["A Transient Two-Tone RF Method for the Characterization of Electron Trapping Capture and Emission Dynamics in GaN HEMTs"],"prefix":"10.1109","author":[{"given":"Pedro M.","family":"Tome","sequence":"first","affiliation":[]},{"given":"Filipe M.","family":"Barradas","sequence":"additional","affiliation":[]},{"given":"Luis C.","family":"Nunes","sequence":"additional","affiliation":[]},{"given":"Joao L.","family":"Gomes","sequence":"additional","affiliation":[]},{"given":"Telmo R.","family":"Cunha","sequence":"additional","affiliation":[]},{"given":"Jose C.","family":"Pedro","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2671368"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2019.8700957"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2921338"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2007.907141"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2013.2290216"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2907540"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2018.8439669"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2216535"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EuMIC.2014.6997865"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2018.2880911"}],"event":{"name":"2020 IEEE\/MTT-S International Microwave Symposium (IMS)","start":{"date-parts":[[2020,8,4]]},"location":"Los Angeles, CA, USA","end":{"date-parts":[[2020,8,6]]}},"container-title":["2020 IEEE\/MTT-S International Microwave Symposium (IMS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9212188\/9223768\/09223802.pdf?arnumber=9223802","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,23]],"date-time":"2024-01-23T19:58:02Z","timestamp":1706039882000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9223802\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ims30576.2020.9223802","relation":{},"subject":[],"published":{"date-parts":[[2020,8]]}}}