{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T06:17:03Z","timestamp":1725517023911},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/ims3tw.2010.5503003","type":"proceedings-article","created":{"date-parts":[[2010,7,12]],"date-time":"2010-07-12T14:21:26Z","timestamp":1278944486000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A comparison between voltage and true power based embedded measurements for RF testing"],"prefix":"10.1109","author":[{"given":"Pedro","family":"Mota","sequence":"first","affiliation":[]},{"given":"Jose Machado","family":"da Silva","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.2004.1346790"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2006.379876"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.377887"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1977.1050960"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2009.5158689"},{"journal-title":"Agilent Technologies Fundamentals of RF and Microwave Power Measurements","year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.895531"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.870317"}],"event":{"name":"2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010)","start":{"date-parts":[[2010,6,7]]},"location":"La Grande Motte, France","end":{"date-parts":[[2010,6,9]]}},"container-title":["2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5492034\/5502990\/05503003.pdf?arnumber=5503003","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T23:33:45Z","timestamp":1489880025000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5503003\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/ims3tw.2010.5503003","relation":{},"subject":[],"published":{"date-parts":[[2010,6]]}}}