{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T05:47:17Z","timestamp":1730267237930,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/ims3tw.2014.6997396","type":"proceedings-article","created":{"date-parts":[[2014,12,30]],"date-time":"2014-12-30T23:16:32Z","timestamp":1419981392000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["An I2C based mixed-signal test and measurement infrastructure"],"prefix":"10.1109","author":[{"given":"Antonio Jose","family":"Salazar Escobar","sequence":"first","affiliation":[]},{"given":"Jose Machado","family":"da Silva","sequence":"additional","affiliation":[]},{"given":"Miguel","family":"Correia","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"IEEE 1149 4 Standard for A Mixed-Signal Test Bus Test Technology Technical Committee of the IEEE Computer Society","year":"1999","key":"3"},{"key":"2","article-title":"Scanning solutions: Embedded instrumentation illuminates the future of validation and test","author":"waller","year":"2010","journal-title":"Embedded Design"},{"key":"10","doi-asserted-by":"crossref","first-page":"622","DOI":"10.1109\/BCGIn.2011.165","article-title":"The design and application of i2c bus in the tdlte comprehensive test instrument","author":"fatang","year":"2011","journal-title":"Int Conference on Business Computing and Global Informatization (BCGIN"},{"journal-title":"International Technology Roadmap for Semiconductors (ITRS)","year":"0","key":"1"},{"key":"7","first-page":"79","volume":"29","author":"zadegan","year":"2012","journal-title":"Reusing and retargeting on-chip instrument access procedures in ieee p1687 ieee design & test magazine"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.22"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.18"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2009.4813820"},{"key":"9","first-page":"2012","volume":"5","year":"0","journal-title":"UM10204 I2C-Bus Specification and User Manual Version"},{"journal-title":"How to Use Embedded Instruments and Ijtag\/Jtag-An Ieee P1687 Tutorial","year":"2011","author":"crouch","key":"8"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.2010.5475965"},{"key":"12","doi-asserted-by":"crossref","first-page":"358","DOI":"10.1049\/ip-cds:19960904","article-title":"mixed signal test-techniques, applications and demands","volume":"143","author":"baker","year":"1996","journal-title":"Circuits Devices and Systems IEE Proceedings-"}],"event":{"name":"2014 19th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW)","start":{"date-parts":[[2014,9,17]]},"location":"Porto Alegre","end":{"date-parts":[[2014,9,19]]}},"container-title":["19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6982035\/6997387\/06997396.pdf?arnumber=6997396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,21]],"date-time":"2020-10-21T14:06:09Z","timestamp":1603289169000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6997396\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ims3tw.2014.6997396","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}