{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:04:10Z","timestamp":1725570250436},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,5]]},"DOI":"10.1109\/imtc.2009.5168593","type":"proceedings-article","created":{"date-parts":[[2009,7,22]],"date-time":"2009-07-22T14:51:46Z","timestamp":1248274306000},"page":"973-977","source":"Crossref","is-referenced-by-count":2,"title":["Frequency domain based algorithm for estimation of single-tone multichannel signals"],"prefix":"10.1109","author":[{"given":"Tomas","family":"Radil","sequence":"first","affiliation":[]},{"given":"Pedro M.","family":"Ramos","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Digital Signal Processing Principles Algorithms and Applications","year":"2004","author":"proakis","key":"3"},{"key":"2","first-page":"1447","article-title":"inductive probe for flaw detection in nonmagnetic metallic plates using eddy currents","author":"ribeiro","year":"2008","journal-title":"Proc IEEE International Instrumentation and Technology Conf - I2MTC"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-2241(97)00058-4"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547406"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/19.850394"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.03.011"},{"journal-title":"IEEE Standard for Digitizing Waveform Recorders","first-page":"1057","year":"1994","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.923782"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1984.4315226"}],"event":{"name":"2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2009,5,5]]},"location":"Singapore. Singapore","end":{"date-parts":[[2009,5,7]]}},"container-title":["2009 IEEE Intrumentation and Measurement Technology Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5159258\/5168393\/05168593.pdf?arnumber=5168593","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T16:31:37Z","timestamp":1489768297000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5168593\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/imtc.2009.5168593","relation":{},"subject":[],"published":{"date-parts":[[2009,5]]}}}