{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T07:50:10Z","timestamp":1729669810329,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,7]]},"DOI":"10.1109\/isaf.2012.6297716","type":"proceedings-article","created":{"date-parts":[[2012,9,15]],"date-time":"2012-09-15T05:51:24Z","timestamp":1347688284000},"page":"1-3","source":"Crossref","is-referenced-by-count":1,"title":["Complex dielectric function in lead-free NKN films"],"prefix":"10.1109","author":[{"given":"R.","family":"Schwarz","sequence":"first","affiliation":[]},{"given":"R.","family":"Ayouchi","sequence":"additional","affiliation":[]},{"given":"S. R.","family":"Bhattacharyya","sequence":"additional","affiliation":[]},{"given":"M.","family":"Leal","sequence":"additional","affiliation":[]},{"given":"U.","family":"Mardolcar","sequence":"additional","affiliation":[]},{"given":"L.","family":"Santos","sequence":"additional","affiliation":[]},{"given":"I.","family":"Bdikin","sequence":"additional","affiliation":[]},{"given":"R.","family":"Rai","sequence":"additional","affiliation":[]},{"given":"I.","family":"Coondoo","sequence":"additional","affiliation":[]},{"given":"A.","family":"Kholkin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"439","DOI":"10.1007\/s00339-007-4014-9","article-title":"Structural and optical properties of Bi3.25Nd 0.75Ti3O12 ferroelectric thin films","volume":"a88","author":"ma","year":"2007","journal-title":"Appl Phys"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1063\/1.346951"},{"journal-title":"Electronic Processes in Non-Crystalline Materials","year":"1979","author":"mott","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1002\/pssc.200982473"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1557\/opl.2011.847"},{"key":"6","doi-asserted-by":"crossref","first-page":"1524","DOI":"10.1016\/j.vacuum.2007.04.018","volume":"81","author":"sanguino","year":"2007","journal-title":"Vacuum"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1063\/1.122899"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2010.08.025"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1002\/pssb.19660150224"},{"key":"8","doi-asserted-by":"crossref","first-page":"1875","DOI":"10.1016\/j.nimb.2007.10.044","volume":"266","author":"barradas","year":"2008","journal-title":"Nucl Instr Meth B"},{"key":"11","doi-asserted-by":"crossref","first-page":"3669","DOI":"10.1111\/j.1551-2916.2006.01313.x","article-title":"Normal Sintering of (K,Na)NbO3-Based Ceramics: Influence of Sintering Temperature on Densification, Microstructure, and Electrical Properties","volume":"89","author":"zhen","year":"2006","journal-title":"J Am Ceram Soc"}],"event":{"name":"2012 Joint 21st IEEE ISAF \/ 11th IEEE ECAPD \/ IEEE PFM (ISAF\/ECAPD\/PFM)","start":{"date-parts":[[2012,7,9]]},"location":"Aveiro, Portugal","end":{"date-parts":[[2012,7,13]]}},"container-title":["Proceedings of ISAF-ECAPD-PFM 2012"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6279558\/6297714\/06297716.pdf?arnumber=6297716","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T20:15:42Z","timestamp":1497989742000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6297716\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,7]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/isaf.2012.6297716","relation":{},"subject":[],"published":{"date-parts":[[2012,7]]}}}