{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T13:03:47Z","timestamp":1725455027049},"reference-count":1,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/iscas.2018.8351862","type":"proceedings-article","created":{"date-parts":[[2018,5,4]],"date-time":"2018-05-04T18:00:05Z","timestamp":1525456805000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Live Demonstration: An Automated Test Bench for an 130nm SC DC-DC Converter"],"prefix":"10.1109","author":[{"given":"Ricardo","family":"Madeira","sequence":"first","affiliation":[]},{"given":"Nuno","family":"Correia","sequence":"additional","affiliation":[]},{"given":"Joao Pedro","family":"Oliveira","sequence":"additional","affiliation":[]},{"given":"Nuno","family":"Paulino","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.2209"}],"event":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2018,5,27]]},"location":"Florence","end":{"date-parts":[[2018,5,30]]}},"container-title":["2018 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8334884\/8350884\/08351862.pdf?arnumber=8351862","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,21]],"date-time":"2019-10-21T20:50:35Z","timestamp":1571691035000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8351862\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":1,"URL":"https:\/\/doi.org\/10.1109\/iscas.2018.8351862","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}