{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:12:45Z","timestamp":1729674765889,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/isie.2010.5636319","type":"proceedings-article","created":{"date-parts":[[2010,11,23]],"date-time":"2010-11-23T15:32:05Z","timestamp":1290526325000},"page":"2587-2592","source":"Crossref","is-referenced-by-count":1,"title":["Series-shunt power active filter for high penetration of embedded production one dynamic approach"],"prefix":"10.1109","author":[{"given":"Jose","family":"Puga","sequence":"first","affiliation":[]},{"given":"Judite","family":"Ferreira","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2008.921146"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2008.4668865"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/PECON.2008.4762561"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.852843"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2009.4918490"},{"key":"5","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1109\/CCECE.2008.4564497","article-title":"Effect of distributed generation on voltage flicker in distributed systems: A case study","author":"morsi","year":"2008","journal-title":"Electrical and Computer Engineering 2008"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TDC-LA.2008.4641848"},{"key":"9","article-title":"Methods of qualitative theory in nonlinear dynamics","volume":"4 5","author":"shilnikov","year":"2005","journal-title":"World Scientific Series on Nonlinear Science Series A Part 1"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2003.1267279"}],"event":{"name":"2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)","start":{"date-parts":[[2010,7,4]]},"location":"Bari, Italy","end":{"date-parts":[[2010,7,7]]}},"container-title":["2010 IEEE International Symposium on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5609073\/5635477\/05636319.pdf?arnumber=5636319","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T12:28:29Z","timestamp":1497875309000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5636319\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/isie.2010.5636319","relation":{},"subject":[],"published":{"date-parts":[[2010,7]]}}}