{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T04:17:16Z","timestamp":1771647436354,"version":"3.50.1"},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1109\/issre.2013.6698881","type":"proceedings-article","created":{"date-parts":[[2014,1,6]],"date-time":"2014-01-06T12:09:09Z","timestamp":1389010149000},"page":"288-297","source":"Crossref","is-referenced-by-count":41,"title":["A pattern-based approach for GUI modeling and testing"],"prefix":"10.1109","author":[{"given":"Rodrigo M. L. M.","family":"Moreira","sequence":"first","affiliation":[]},{"given":"Ana C. R.","family":"Paiva","sequence":"additional","affiliation":[]},{"given":"Atif","family":"Memon","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","first-page":"16","article-title":"Modelbased testing through a GUI","author":"kervinen","year":"2006","journal-title":"Proceedings of the 5th International Workshop on Formal Approaches to Testing of Software (FATES 2005) Number 3997 in Lecture Notes in Computer Science"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2000.885865"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ITNG.2008.145"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1007\/s11334-007-0042-z"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2001.989456"},{"key":"13","year":"0","journal-title":"Google"},{"key":"14","article-title":"Patterns for testing in global software development","author":"pehmo?ller","year":"2010","journal-title":"Proceedings of the 13th International Conference on Quality Engineering in Software Technology"},{"key":"11","author":"hung","year":"0","journal-title":"Australian Charts Portal"},{"key":"12","author":"inc","year":"0","journal-title":"Apple - ITunes - Everything you need to be Entertained"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/ITNG.2011.54"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1145\/503209.503244"},{"key":"22","doi-asserted-by":"crossref","first-page":"212","DOI":"10.1109\/ICSTW.2011.59","article-title":"Event-based GUI testing and reliability assessment techniques - An experimental insight and preliminary results","author":"belli","year":"2011","journal-title":"Proceedings of the 2011 IEEE Fourth International Conference on Software Testing Verification and Validation Workshops Ser ICSTW'11"},{"key":"23","author":"datentechnik","year":"0","journal-title":"TSD - Test Suite Designer"},{"key":"24","doi-asserted-by":"crossref","first-page":"450","DOI":"10.1007\/11576280_31","article-title":"A model-to-implementation mapping tool for automated model-based GUI testing","volume":"3785","author":"paiva","year":"2005","journal-title":"ICFEM Ser Lecture Notes in Computer Science"},{"key":"25","first-page":"104","article-title":"Visual abstract notation for GUI modelling and testing - VAN4GUIM","author":"moreira","year":"2008","journal-title":"ICSOFT (SE\/MUSE\/GSDCA) J Cordeiro B Shishkov A Ranchordas and M Helfert"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1145\/1996461.1996516"},{"key":"3","author":"tidwell","year":"2011","journal-title":"Designing Interfaces"},{"key":"2","year":"2012","journal-title":"UI Design Patterns and Library Builder"},{"key":"10","year":"0","journal-title":"Mobile de - Germany's Biggest Vehicle Marketplace Online Search Buy and Sell Used and New Vehicles"},{"key":"1","author":"neil","year":"0","journal-title":"12 Standard Screen Patterns"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1002\/spe.936"},{"key":"6","year":"0","journal-title":"Yahoo! Design Pattern Library"},{"key":"5","author":"van welie","year":"0","journal-title":"Interaction Design Pattern Library"},{"key":"4","author":"toxboe","year":"0","journal-title":"UI Patterns - User Interface Design Pattern Library"},{"key":"9","author":"skrypuch","year":"0","journal-title":"Eclipse Modeling EMF Home"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-35175-9_58"}],"event":{"name":"2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE)","location":"Pasadena, CA, USA","start":{"date-parts":[[2013,11,4]]},"end":{"date-parts":[[2013,11,7]]}},"container-title":["2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6689494\/6698873\/06698881.pdf?arnumber=6698881","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T01:23:08Z","timestamp":1498094588000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6698881\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,11]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/issre.2013.6698881","relation":{},"subject":[],"published":{"date-parts":[[2013,11]]}}}