{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T13:18:11Z","timestamp":1773926291505,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Instituto de Telecomunica\u00e7\u00f5es"},{"DOI":"10.13039\/501100001871","name":"Portuguese Science and Technology Foundation","doi-asserted-by":"crossref","award":["UID\/EEA\/50008\/2019"],"award-info":[{"award-number":["UID\/EEA\/50008\/2019"]}],"id":[{"id":"10.13039\/501100001871","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001871","name":"Portuguese Science and Technology Foundation","doi-asserted-by":"crossref","award":["PTDC\/EEI\/EEE\/30723\/2017"],"award-info":[{"award-number":["PTDC\/EEI\/EEE\/30723\/2017"]}],"id":[{"id":"10.13039\/501100001871","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Sensors J."],"published-print":{"date-parts":[[2020,3,1]]},"DOI":"10.1109\/jsen.2019.2951302","type":"journal-article","created":{"date-parts":[[2019,11,5]],"date-time":"2019-11-05T04:33:49Z","timestamp":1572928429000},"page":"2329-2338","source":"Crossref","is-referenced-by-count":40,"title":["Detection and Classification of Defects Using ECT and Multi-Level SVM Model"],"prefix":"10.1109","volume":"20","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2935-043X","authenticated-orcid":false,"given":"Dario Jeronimo","family":"Pasadas","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9239-9765","authenticated-orcid":false,"given":"Prashanth","family":"Baskaran","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4931-7960","authenticated-orcid":false,"given":"Helena Geirinhas","family":"Ramos","sequence":"additional","affiliation":[]},{"given":"Artur Lopes","family":"Ribeiro","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236729"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2292326"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2014.07.003"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2792848"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2893009"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2009.5168668"},{"key":"ref16","article-title":"Detection of sub-surface crack using ECT with planar excitation coil, GMR and TMR sensors","author":"pasadas","year":"2019","journal-title":"Proc Int Workshop Electromagn Nondestruct Eval (ENDE)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1986.1085837"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.12.015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2682758"},{"key":"ref4","first-page":"11","article-title":"Gas pipeline corrosion mapping using pulsed eddy current technique","volume":"5","author":"safizadeh","year":"2011","journal-title":"Int J Adv Design Manuf Technol"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2032330"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MetroAeroSpace.2018.8453579"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2341653"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.919011"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.11.005"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2009.06.009"},{"key":"ref1","author":"rao","year":"2007","journal-title":"Practical Eddy Current Testing"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2009.10.003"},{"key":"ref20","author":"michell","year":"1997","journal-title":"Machine Learning"}],"container-title":["IEEE Sensors Journal"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7361\/8984669\/08890621.pdf?arnumber=8890621","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T16:23:12Z","timestamp":1651076592000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8890621\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3,1]]},"references-count":20,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/jsen.2019.2951302","relation":{},"ISSN":["1530-437X","1558-1748","2379-9153"],"issn-type":[{"value":"1530-437X","type":"print"},{"value":"1558-1748","type":"electronic"},{"value":"2379-9153","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,3,1]]}}}