{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T06:58:48Z","timestamp":1760597928800},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/mim.2019.8917897","type":"journal-article","created":{"date-parts":[[2019,11,28]],"date-time":"2019-11-28T22:06:42Z","timestamp":1574978802000},"page":"4-10","source":"Crossref","is-referenced-by-count":3,"title":["Built-in self test of high speed analog-to-digital converters"],"prefix":"10.1109","volume":"22","author":[{"given":"Edinei","family":"Santin","sequence":"first","affiliation":[]},{"given":"Luis B.","family":"Oliveira","sequence":"additional","affiliation":[]},{"given":"Joao","family":"Goes","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2143811"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2002.1006838"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2043885"},{"key":"ref6","volume":"36","year":"2011","journal-title":"Future Fab International Special Focus International Technology Roadmap for Semiconductors"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/4.748183"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1007\/b117406","author":"bushnell","year":"2002","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2034582"},{"key":"ref8","author":"santin","year":"0","journal-title":"A Built-In Self-Test Technique for High Speed Analog-to-Digital Converters"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2143230"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.293454"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908343"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2017.7864545"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/8917889\/08917897.pdf?arnumber=8917897","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:45Z","timestamp":1696518705000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8917897\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":12,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mim.2019.8917897","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,12]]}}}