{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T00:01:23Z","timestamp":1755993683743,"version":"3.44.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2015,5,1]],"date-time":"2015-05-01T00:00:00Z","timestamp":1430438400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2015,5,1]],"date-time":"2015-05-01T00:00:00Z","timestamp":1430438400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/mwsym.2015.7166977","type":"proceedings-article","created":{"date-parts":[[2015,7,27]],"date-time":"2015-07-27T17:24:56Z","timestamp":1438017896000},"page":"1-4","source":"Crossref","is-referenced-by-count":20,"title":["A new nonlinear model extraction methodology for GaN HEMTs subject to trapping effects"],"prefix":"10.1109","author":[{"given":"Lu\u00eds C.","family":"Nunes","sequence":"first","affiliation":[{"name":"DETI, Instituto de Telecomunicações, Universidade de Aveiro, Campus Universitário de Santiago, 3810-193, Portugal"}]},{"given":"Jos\u00e9 M.","family":"Gomes","sequence":"additional","affiliation":[{"name":"DETI, Instituto de Telecomunicações, Universidade de Aveiro, Campus Universitário de Santiago, 3810-193, Portugal"}]},{"given":"Pedro M.","family":"Cabral","sequence":"additional","affiliation":[{"name":"DETI, Instituto de Telecomunicações, Universidade de Aveiro, Campus Universitário de Santiago, 3810-193, Portugal"}]},{"given":"Jos\u00e9 C.","family":"Pedro","sequence":"additional","affiliation":[{"name":"DETI, Instituto de Telecomunicações, Universidade de Aveiro, Campus Universitário de Santiago, 3810-193, Portugal"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2010.2058934"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2013.2290216"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2002.1012214"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2313814"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2193140"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2004.837196"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2227779"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/16.535316"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EuMC.2014.6986681"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2007.907141"}],"event":{"name":"2015 IEEE MTT-S International Microwave Symposium (IMS2015)","start":{"date-parts":[[2015,5,17]]},"location":"Phoenix, AZ, USA","end":{"date-parts":[[2015,5,22]]}},"container-title":["2015 IEEE MTT-S International Microwave Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7155722\/7166703\/07166977.pdf?arnumber=7166977","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:26:19Z","timestamp":1755908779000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7166977\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/mwsym.2015.7166977","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}