{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:55:31Z","timestamp":1778604931888,"version":"3.51.4"},"reference-count":105,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE\u00a0Open J. Ind. Electron. Soc."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/ojies.2024.3431240","type":"journal-article","created":{"date-parts":[[2024,7,19]],"date-time":"2024-07-19T17:44:08Z","timestamp":1721411048000},"page":"1085-1103","source":"Crossref","is-referenced-by-count":30,"title":["Machine Learning Applications in Manufacturing\u2014Challenges, Trends, and Future Directions"],"prefix":"10.1109","volume":"5","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2210-157X","authenticated-orcid":false,"given":"Alexandre","family":"Manta-Costa","sequence":"first","affiliation":[{"name":"UNINOVA—Centre of Technology and Systems (CTS), FCT Campus, Caparica, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6192-8409","authenticated-orcid":false,"given":"Sara Oleiro","family":"Ara\u00fajo","sequence":"additional","affiliation":[{"name":"UNINOVA—Centre of Technology and Systems (CTS), FCT Campus, Caparica, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3777-1346","authenticated-orcid":false,"given":"Ricardo Silva","family":"Peres","sequence":"additional","affiliation":[{"name":"UNINOVA—Centre of Technology and Systems (CTS), FCT Campus, Caparica, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6348-1847","authenticated-orcid":false,"given":"Jos\u00e9","family":"Barata","sequence":"additional","affiliation":[{"name":"UNINOVA—Centre of Technology and Systems (CTS), FCT Campus, Caparica, Portugal"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/FSKD.2015.7382284"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2022.06.008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosrev.2020.100341"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1186\/s10033-020-00459-x"},{"key":"ref5","article-title":"Industrial artificial intelligence","author":"Lee","year":"2019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.mfglet.2018.09.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.4324\/9780429060168-1"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2014.2349359"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.119456"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-021-00600-3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3262138"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-2144-7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3042874"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-2144-7_3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-2144-7_4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-018-3106-3"},{"key":"ref17","first-page":"349","article-title":"Unlocking the power of industrial artificial intelligence towards industry 5.0: Insights, pathways, and challenges","volume-title":"J. Manuf. Syst.","volume":"73","author":"Leng","year":"2024"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1108\/JMTM-02-2018-0057"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2022.09.186"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/app11073086"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3004555"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3013541"},{"key":"ref23","article-title":"A review of applications in federated learning","volume-title":"Comput. Ind. Eng.","volume":"149","author":"Li","year":"2020"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106775"},{"key":"ref25","first-page":"265","article-title":"{TensorFlow}: A. system for {Large-Scale} machine learning","volume-title":"Proc. 12th USENIX Symp. Operating Syst. Des. Implementation","author":"Abadi","year":"2016"},{"key":"ref26","first-page":"8026","article-title":"Pytorch: An imperative style, high-performance deep learning library","volume-title":"Proc. Int. Conf. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Paszke","year":"2019"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1365490.1365500"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4842-2766-4_7"},{"key":"ref29","article-title":"JAX: Composable transformations of python NumPy programs","author":"Bradbury","year":"2018"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-33383-0_5"},{"issue":"11","key":"ref31","first-page":"120","article-title":"The openCV library","volume":"25","author":"Bradski","year":"2000","journal-title":"Dr Dobbs J.: Softw. Tools Professional Programmer"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref33","article-title":"Technology readiness levels","author":"Mankins","year":"1995"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1115\/1.4047855"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.01.002"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ice.2018.8436307"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/bigdatacongress.2018.00028"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103528"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2023.103903"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/3439950"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/WCICA.2018.8630692"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2017.2714135"},{"issue":"11","key":"ref43","article-title":"Recent advances in anomaly detection methods applied to aviation","volume-title":"Aerospace","volume":"6","author":"Basora","year":"2019"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/SOCA.2019.00021"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3349132"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-03988-5"},{"key":"ref47","article-title":"Simulation optimization applied to production scheduling in the era of industry 4.0: A review and future roadmap","volume-title":"J. Ind. Inf. Integration","volume":"39","author":"Ghasemi","year":"2024"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01531-7"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2021.10.042"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2020.1766713"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2023.102568"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2022.102412"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.03.002"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2023.102564"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2915846"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2023.103919"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2021.04.008"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2022.102453"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2023.102574"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2747942."},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110276"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2023.2217293"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2020.103298"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3166790"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2020.101975"},{"key":"ref66","article-title":"A survey of predictive maintenance: Systems, purposes and approaches","author":"Ran","year":"2019"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2019.2957029"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2917604"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/lra.2020.3013848"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.3390\/app12178534"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirpj.2024.03.005"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1016\/j.jii.2022.100383"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/assic60049.2024.10507923"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/SEAA53835.2021.00050"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/SYNASC51798.2020.00015"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1145\/3609333"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2020.3019788"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.3390\/app11125320"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1145\/3453155"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.02.007"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3294569"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3090990"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2020.1718794"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01808-w"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2022.103764"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2020.103247"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2020.101101"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2022.12.234"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-024-13075-z"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2023.2172473"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2021.102231"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3143148"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2021.127555"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.3390\/su15021441"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2020.2967556"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2019.01.006"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2022.103771"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103485"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2019.103184"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.07.002"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103459"},{"key":"ref102","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.101920"},{"key":"ref103","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.05.005"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.11.008"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2022.06.010"}],"container-title":["IEEE Open Journal of the Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8782706\/10417853\/10605047.pdf?arnumber=10605047","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,16]],"date-time":"2025-01-16T18:47:48Z","timestamp":1737053268000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10605047\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":105,"URL":"https:\/\/doi.org\/10.1109\/ojies.2024.3431240","relation":{},"ISSN":["2644-1284"],"issn-type":[{"value":"2644-1284","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}