{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T22:46:16Z","timestamp":1725403576979},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2002.1030201","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T18:14:31Z","timestamp":1056564871000},"page":"165-169","source":"Crossref","is-referenced-by-count":10,"title":["Active replication: towards a truly SRAM-based FPGA on-line concurrent testing"],"prefix":"10.1109","author":[{"given":"M.G.","family":"Gericota","sequence":"first","affiliation":[]},{"given":"G.R.","family":"Alves","sequence":"additional","affiliation":[]},{"given":"M.L.","family":"Silva","sequence":"additional","affiliation":[]},{"given":"J.M.","family":"Ferreira","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/12.822563"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/54.655181"},{"key":"ref12","first-page":"82","article-title":"RAM-Based FPGA's: A Test Approach for the Configurable Logic","author":"renovell","year":"1998","journal-title":"Proc DATE Conf"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/54.655182"},{"key":"ref14","first-page":"2","article-title":"On-Line Testing and Diagnosis of FPGAs with Roving STARs","author":"abramovici","year":"1999","journal-title":"Proc 5th IEEE Int On-Line Testing Workshop"},{"journal-title":"IEEE Std Test Access Port and Boundary Scan Architecture (IEEE Std 1149 1)","year":"1990","key":"ref15"},{"key":"ref16","first-page":"70","article-title":"Dynamic Replication: The Core of a Truly Non-Intrusive SRAM-based FPGA Structural Concurrent Test Methodology","author":"gericota","year":"0"},{"journal-title":"The Programmable Logic Data Book","year":"0","key":"ref17"},{"journal-title":"Politecnico di Torino ITC'99 benchmarks","year":"0","key":"ref18"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/360276.360344"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/92.736139"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510883"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2001.937814"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743180"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639662"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/92.678870"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/12.656073"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/92.678888"}],"event":{"name":"Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)","acronym":"OLT-02","location":"Isle of Bendor, France"},"container-title":["Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8008\/22136\/01030201.pdf?arnumber=1030201","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T16:44:49Z","timestamp":1489164289000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1030201\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/olt.2002.1030201","relation":{},"subject":[]}}