{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:20:19Z","timestamp":1740100819168,"version":"3.37.3"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,29]],"date-time":"2022-06-29T00:00:00Z","timestamp":1656460800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,29]],"date-time":"2022-06-29T00:00:00Z","timestamp":1656460800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006129","name":"FCT","doi-asserted-by":"publisher","award":["UIDB\/04730\/2020"],"award-info":[{"award-number":["UIDB\/04730\/2020"]}],"id":[{"id":"10.13039\/100006129","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,29]]},"DOI":"10.1109\/taee54169.2022.9840742","type":"proceedings-article","created":{"date-parts":[[2022,8,9]],"date-time":"2022-08-09T20:50:59Z","timestamp":1660078259000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Hardware Test subjects in academic education"],"prefix":"10.1109","author":[{"given":"Ruben","family":"Sarmento","sequence":"first","affiliation":[{"name":"School of Engineering(ISEP), Polytechnic of Porto (P.Porto),Porto,Portugal,4249-015"}]},{"given":"Filipe","family":"Pereira","sequence":"additional","affiliation":[{"name":"CIETI, School of Engineering (ISEP), Polytechnic of Porto (P.Porto),Porto,Portugal,4249-015"}]},{"given":"Carlos","family":"Felgueiras","sequence":"additional","affiliation":[{"name":"School of Engineering(ISEP), Polytechnic of Porto (P.Porto),Porto,Portugal,4249-015"}]}],"member":"263","reference":[{"year":"0","key":"ref10"},{"year":"0","key":"ref11"},{"year":"0","key":"ref12"},{"key":"ref13","volume":"1149 1 4","author":"da rocha","year":"0","journal-title":"Plataforma Didática Baseada nas Infraestruturas IEEE"},{"key":"ref14","volume":"1149 1 4","author":"vilhena","year":"0","journal-title":"Experimentaçño remota de infraestruturas IEEE"},{"year":"0","author":"vilhena","journal-title":"A proposal to support IEEE 1149 1\/4 Infrastructures experimentation","key":"ref15"},{"year":"0","author":"vilhena","journal-title":"A demonstration circuit to support e-leaning on IEEE 1149 1\/4 infrastructures","key":"ref16"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1117\/12.551288"},{"key":"ref3","article-title":"5G Hardware Test Evaluation Platform","author":"dd","year":"2018","journal-title":"5G Wireless Systems"},{"year":"0","key":"ref6"},{"year":"0","key":"ref5"},{"year":"0","key":"ref8"},{"year":"0","key":"ref7"},{"year":"2021","author":"sarmento","journal-title":"Electronic product testing in the context of production","key":"ref2"},{"key":"ref1","volume":"1149 4","author":"felgueiras","year":"0","journal-title":"Apoio à depuração e teste de circuitos mistos com-patíveis com a norma IEEE"},{"year":"0","key":"ref9"}],"event":{"name":"2022 Congreso de Tecnolog\u00eda, Aprendizaje y Ense\u00f1anza de la Electr\u00f3nica (XV Technologies Applied to Electronics Teaching Conference (TAEE)","start":{"date-parts":[[2022,6,29]]},"location":"Teruel, Spain","end":{"date-parts":[[2022,7,1]]}},"container-title":["2022 Congreso de Tecnolog\u00eda, Aprendizaje y Ense\u00f1anza de la Electr\u00f3nica (XV Technologies Applied to Electronics Teaching Conference)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9840522\/9840525\/09840742.pdf?arnumber=9840742","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,29]],"date-time":"2022-08-29T21:51:12Z","timestamp":1661809872000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9840742\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,29]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/taee54169.2022.9840742","relation":{},"subject":[],"published":{"date-parts":[[2022,6,29]]}}}