{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:04:56Z","timestamp":1761581096335},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2013,10,1]],"date-time":"2013-10-01T00:00:00Z","timestamp":1380585600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Compon., Packag. Manufact. Technol."],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/tcpmt.2013.2260861","type":"journal-article","created":{"date-parts":[[2013,6,6]],"date-time":"2013-06-06T18:13:31Z","timestamp":1370542411000},"page":"1754-1763","source":"Crossref","is-referenced-by-count":19,"title":["A Novel Two-Port Behavioral Model for I\/O Buffer Overclocking Simulation"],"prefix":"10.1109","volume":"3","author":[{"given":"Wael","family":"Dghais","sequence":"first","affiliation":[]},{"given":"Telmo","family":"Reis Cunha","sequence":"additional","affiliation":[]},{"given":"Jose Carlos","family":"Pedro","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2011.2138704"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2012.2213254"},{"key":"ref12","author":"kibe","year":"2012","journal-title":"The VOICE from practical designing with SI simulation"},{"key":"ref13","author":"torigoshi","year":"2012","journal-title":"Over-clocking model validation"},{"key":"ref14","author":"coyle","year":"2010","journal-title":"An Engineer's Guide to Hacking IBIS Models"},{"key":"ref15","author":"wang","year":"2007","journal-title":"Initial time delay issue in IBIS VT curves"},{"key":"ref16","author":"labonte","year":"2007","journal-title":"Study of IBIS waveform time offsets how IBIS simulators handle offset and aligned IBIS waveform data"},{"key":"ref17","author":"wang","year":"2009","journal-title":"Case study Analyze different results from IBIS simulators"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/EPEPS.2012.6457882"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2005.846931"},{"key":"ref4","year":"2008","journal-title":"IBIS Modeling Cookbook"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/9780470772874"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2012.2234212"},{"key":"ref5","author":"forum","year":"2012","journal-title":"I\/O Buffer Information Specification Version 5 1"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2004.825475"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SaPIW.2012.6222919"},{"key":"ref2","author":"rabaey","year":"2003","journal-title":"Digital Integrated Circuits A Design Perspective"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2005.848396"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2004.1273994"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20045116"},{"key":"ref22","author":"normey-rico","year":"2007","journal-title":"Control of Dead-Time Processes"},{"key":"ref21","first-page":"854","article-title":"Behavioral models of basic mixed mode circuits: Practical issues and application","author":"prodanov","year":"2008","journal-title":"Proc IEEE Eur Conf Circuit Theory Design"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2008.05.004"},{"key":"ref23","author":"astrom","year":"1995","journal-title":"PID Controllers Theory Design and Tuning"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2010.2047920"},{"key":"ref25","first-page":"121","year":"2006","journal-title":"Advanced Design System User-Defined Models"}],"container-title":["IEEE Transactions on Components, Packaging and Manufacturing Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5503870\/6615956\/06525410.pdf?arnumber=6525410","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:41:13Z","timestamp":1638218473000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6525410\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":26,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcpmt.2013.2260861","relation":{},"ISSN":["2156-3950","2156-3985"],"issn-type":[{"value":"2156-3950","type":"print"},{"value":"2156-3985","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,10]]}}}