{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T14:42:10Z","timestamp":1761057730683,"version":"3.40.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2003,4,1]],"date-time":"2003-04-01T00:00:00Z","timestamp":1049155200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2003,4]]},"DOI":"10.1109\/tim.2003.810731","type":"journal-article","created":{"date-parts":[[2003,6,5]],"date-time":"2003-06-05T17:45:41Z","timestamp":1054835141000},"page":"563-568","source":"Crossref","is-referenced-by-count":17,"title":["The european acqhe project: modular system for the calibration of capacitance standards based on the quantum hall effect"],"prefix":"10.1109","volume":"52","author":[{"given":"J.","family":"Melcher","sequence":"first","affiliation":[]},{"given":"J.","family":"Schurr","sequence":"additional","affiliation":[]},{"given":"K.","family":"Pierz","sequence":"additional","affiliation":[]},{"given":"J.M.","family":"Williams","sequence":"additional","affiliation":[]},{"given":"S.P.","family":"Giblin","sequence":"additional","affiliation":[]},{"given":"F.","family":"Cabiati","sequence":"additional","affiliation":[]},{"given":"L.","family":"Callegaro","sequence":"additional","affiliation":[]},{"given":"G.","family":"Marullo-Reedtz","sequence":"additional","affiliation":[]},{"given":"C.","family":"Cassiago","sequence":"additional","affiliation":[]},{"given":"B.","family":"Jeckelmann","sequence":"additional","affiliation":[]},{"given":"B.","family":"Jeanneret","sequence":"additional","affiliation":[]},{"given":"F.","family":"Overney","sequence":"additional","affiliation":[]},{"given":"J.","family":"Bohacek","sequence":"additional","affiliation":[]},{"given":"J.","family":"Riha","sequence":"additional","affiliation":[]},{"given":"O.","family":"Power","sequence":"additional","affiliation":[]},{"given":"J.","family":"Murray","sequence":"additional","affiliation":[]},{"given":"M.","family":"Nunes","sequence":"additional","affiliation":[]},{"given":"M.","family":"Lobo","sequence":"additional","affiliation":[]},{"given":"I.","family":"Godinho","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"first-page":"143","volume-title":"Bur. Int. Poids et Mesures","year":"1998","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/64\/12\/201"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.33.2965"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.119761"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/31\/5\/004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/19.278568"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.769590"},{"key":"ref8","first-page":"1675","volume":"3","author":"Viehweger","year":"1991","journal-title":"J. Phys.: Condens. Matter"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"269","DOI":"10.1109\/19.571829","volume":"46","author":"Wood","year":"1997","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/39\/1\/2"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/39\/1\/3"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"659","DOI":"10.1088\/0026-1394\/37\/6\/3","volume":"37","author":"Delahaye","year":"2000","journal-title":"Metrologia"},{"key":"ref13","first-page":"203","volume-title":"Coaxial AC Bridges","author":"Kibble","year":"1984"},{"issue":"3","key":"ref14","doi-asserted-by":"crossref","first-page":"241","DOI":"10.1088\/0026-1394\/38\/3\/7","volume":"38","author":"Boh\u00e1\u010dek","year":"2001","journal-title":"Metrologia"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.6028\/jres.072C.005"},{"volume-title":"ISO","year":"1995","key":"ref16"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/27069\/01202098.pdf?arnumber=1202098","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T12:52:06Z","timestamp":1743339126000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1202098\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,4]]},"references-count":16,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2003,4]]}},"URL":"https:\/\/doi.org\/10.1109\/tim.2003.810731","relation":{},"ISSN":["0018-9456"],"issn-type":[{"type":"print","value":"0018-9456"}],"subject":[],"published":{"date-parts":[[2003,4]]}}}