{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T19:38:41Z","timestamp":1648669121049},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2012,1,1]],"date-time":"2012-01-01T00:00:00Z","timestamp":1325376000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,1]]},"DOI":"10.1109\/tim.2011.2161014","type":"journal-article","created":{"date-parts":[[2011,8,15]],"date-time":"2011-08-15T20:19:27Z","timestamp":1313439567000},"page":"9-16","source":"Crossref","is-referenced-by-count":3,"title":["Choosing Between Terminal and Independently Based Gain and Offset Error in the ADC Histogram Test"],"prefix":"10.1109","volume":"61","author":[{"given":"Francisco Corr\u00eaa","family":"Alegria","sequence":"first","affiliation":[]},{"given":"Hugo","family":"Placido da Silva","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.293454"},{"key":"ref11","first-page":"88","article-title":"Noise sensitivity of the ADC histogram test","author":"carbone","year":"2000","journal-title":"Proc 15th IEEE Instrum Meas Technol Conf"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/81.645145"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2001.929521"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297679"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(00)00043-X"},{"key":"ref16","first-page":"91","article-title":"Design of ADC histogram test: A practical case","author":"chiorboli","year":"2000","journal-title":"Proc 5th Workshop ADC Model Test"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5538006"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5196-9"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052232"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.2307\/2333709"},{"key":"ref3","year":"2008","journal-title":"Evaluation of Measurement DataSupplement 1 to the Guide to the Expression of Uncertainty in MeasurementPropagation of Distributions Using a Monte Carlo Method 1st ed JGCM"},{"key":"ref6","year":"2000","journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"},{"key":"ref5","year":"1997","journal-title":"Semiconductor DevicesIntegrated CircuitsPart 4 Interface Integrated Circuits 2nd ed"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.85350"},{"key":"ref7","year":"2008","journal-title":"IEEE Standard for Digitizing Waveform Recorders"},{"key":"ref2","year":"1995","journal-title":"GUM Guide to the Expression of Uncertainty in Measurement"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.910106"},{"key":"ref1","first-page":"28","article-title":"Uncertainty in the ADC Transition voltages determined with the histogram method","author":"corra alegria","year":"2001","journal-title":"Proc 6th Euro Workshop ADC Model Test"},{"key":"ref20","first-page":"1","article-title":"Comparison of the precision of gain and offset estimations obtained with the histogram test of ADCs","author":"corra alegria","year":"2009","journal-title":"Proc XIX IMEKO World Congr Fundam Appl Metrol"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2005261"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.907978"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2004.03.003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.csi.2005.07.003"},{"key":"ref26","first-page":"392","author":"chakravarti","year":"1967","journal-title":"Handbook of Methods of Applied Statistics"},{"key":"ref25","doi-asserted-by":"crossref","DOI":"10.1002\/9780470316849","author":"scott","year":"1992","journal-title":"Multivariate Density Estimation Theory Practice and Visualization"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6095456\/05971784.pdf?arnumber=5971784","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:53:13Z","timestamp":1642006393000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5971784\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,1]]},"references-count":27,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2161014","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,1]]}}}