{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T22:24:50Z","timestamp":1759184690751},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2002,6,1]],"date-time":"2002-06-01T00:00:00Z","timestamp":1022889600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Nucl. Sci."],"published-print":{"date-parts":[[2002,6]]},"DOI":"10.1109\/tns.2002.1039582","type":"journal-article","created":{"date-parts":[[2002,11,21]],"date-time":"2002-11-21T20:12:04Z","timestamp":1037909524000},"page":"875-880","source":"Crossref","is-referenced-by-count":10,"title":["The micro-hole-and-strip plate gas detector: experimental results"],"prefix":"10.1109","volume":"49","author":[{"given":"J.M.","family":"Maia","sequence":"first","affiliation":[{"name":"Phys. Dept., Univ. of Beira Interior, Covilha, Portugal"}]},{"given":"J.F.C.A.","family":"Veloso","sequence":"additional","affiliation":[]},{"given":"R.E.","family":"Morgado","sequence":"additional","affiliation":[]},{"given":"J.M.F.","family":"dos Santos","sequence":"additional","affiliation":[]},{"given":"C.A.N.","family":"Conde","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1431438"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.1150623"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"297","DOI":"10.1016\/S0168-9002(00)01063-9","article-title":"driftless gas proportional scintillation counter for muonic hydrogen x-ray spectroscopy under strong magnetic fields","volume":"a 460","author":"veloso","year":"2001","journal-title":"Nucl Instrum Methods"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(02)00908-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(99)00820-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/0168-9002(92)90236-W"},{"key":"ref7","author":"tech-etch","year":"0","journal-title":"Inc"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(96)01172-2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/23.940090"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0168-9002(88)90970-9"}],"container-title":["IEEE Transactions on Nuclear Science"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/23\/22285\/01039582.pdf?arnumber=1039582","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:08:00Z","timestamp":1642003680000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1039582\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,6]]},"references-count":10,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tns.2002.1039582","relation":{},"ISSN":["0018-9499","1558-1578"],"issn-type":[{"value":"0018-9499","type":"print"},{"value":"1558-1578","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,6]]}}}